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1. Light-induced persistence of leakage current and low frequency noise in reverse biased backside-illuminated Hg1-xCdxTe photodiodes

Author

R. DeWames, M. Hinnrichs, G. Williams, and J. Bajaj

Subjects
Photocurrent, business.industry, Chemistry, Infrasound, Photodiode, law.invention, Optics, Ion implantation, law, Back-illuminated sensor, Optoelectronics, business, Noise (radio), Diode, Dark current
Abstract

Backside illumination of Hg 1-x Cd x Te photodiodes at low temperature increases the low frequency excess noise. The photodiodes tested were formed by ion implantation of LPE Hg 1-x Cd x Te on CdTe substrates. During illumination, the excess noise increase is proportional to the photocurrent for backgrounds which induce a current in the 10-5A cm-2range. After illumination the increased dark current and excess noise in a reverse biased diode persist for hours in some of the diodes tested. Persistence is not observed after illumination for zero bias.

Published
1985
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