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The topography of surfaces produced by metal additive manufacturing is a challenge for optical measurement systems such as focus variation microscopes. These irregularities can lead to artifacts, such as incorrectly measured protrusions or spikes, hampering reliable topographic characterization. In order to eliminate this problem, we introduce a new algorithm based on dual convolving a vertical Sobel operator with cross sections of an image stack parallel to the scanning direction of the so-called depth scan. This has proven beneficial in order to distinguish the focus region from out-of-focus areas where outliers are frequently detected. This paper introduces a method for deriving self-adaptive thresholds from the convolution result and compares the effects of different operators in creating self-adaptive thresholds. Additionally, a simulation model of focus variation microscopy is introduced to validate both the measuring system and the proposed algorithm, thereby enhancing the overall performance of focus variation microscopy. Finally, comparisons of measurement results on rough metal additive manufacturing workpieces with and without self-adaptive thresholds are discussed to demonstrate the algorithm's effectiveness.The utilization of self-adaptive thresholds demonstrably reduces the uncertainty range in roughness parameter calculations. For example, in the case of an additive manufactured metal sample due to outlier elimination, the S z roughness value reduces from 543 µm to 413 µm. [ABSTRACT FROM AUTHOR]

Due to their contactless and fast measuring capabilities, laser interferometers represent an interesting alternative to tactile stylus instruments for surface profilometry. In addition to these outstanding attributes, acquisition costs play a major role in industry, limiting the frequent use of optical profilometers, which are significantly more expensive than tactile profilometers. We present a low-cost laser distance-measuring interferometer featuring axial repeatability below 1 nm at acquisition rates of 38,000 height values per second. The sensor's performance is validated on several surface standards, achieving lateral scan velocities up to 160 mm/s. Further to high scan velocities, the high acquisition rate enables improved measurement accuracy by averaging measured height values. For example, the standard deviation of 625 pm for repeated measurements can be reduced to 265 pm at the expense of the data rate. However, the sensor concept provides the potential for further improvements in data rate and measurement repeatability. [ABSTRACT FROM AUTHOR]

Rough surfaces such as metal additive manufactured surfaces are quite challenging for measurement. Artifacts caused by irregular and difficult-to-measure geometries are inevitable. Removing all the artifacts would cause a portion of surface information to be missing. Different from previous works, the postprocessing in this paper includes an additional step to eliminate artifacts based on autocorrelation functions of particular subimages instead of simply removing them. This increases the accuracy with respect to surface roughness and provides a more comprehensive view on the topography. In addition, a dome shape LED array ring light is proposed to provide all-round lighting due to the high degree of irregularity of workpiece surfaces. The experimental results obtained from FVM are validated and compared with the given roughness values of a Rubert Microsurf 329 comparator test panel as well as measurement results of a metal additive workpiece by a confocal microscope. [ABSTRACT FROM AUTHOR]

We present a Mirau-type coherence scanning interferometer (CSI) with an oscillating reference mirror and an integrated interferometric distance sensor (IDS) sharing the optical path with the CSI. The IDS works simultaneously with the CSI and measures the distance changes during the depth scanning process with high temporal resolution. The additional information acquired by the IDS is used to correct the CSI data disturbed by unwanted distance changes due to environmental vibrations subsequent to the measurement. Due to the fixed reference mirror in commercial Mirau objectives, a Mirau attachment (MA) comprising an oscillating reference mirror is designed and built. Compared to our previous systems based on the Michelson and the Linnik interferometer, the MA represents a novel solution that completes the range of possible applications. Due to its advantages, the Mirau setup is the preferred and most frequently used interferometer type in industry. Therefore, the industrial use is ensured by this development. We investigate the functioning of the system and the capability of the vibration compensation by several measurements on various surface topographies. [ABSTRACT FROM AUTHOR]