1. A High-Flux Compact X-ray Free-Electron Laser for Next-Generation Chip Metrology Needs
- Author
-
Rosenzweig, James B., primary, Andonian, Gerard, additional, Agustsson, Ronald, additional, Anisimov, Petr M., additional, Araujo, Aurora, additional, Bosco, Fabio, additional, Carillo, Martina, additional, Chiadroni, Enrica, additional, Giannessi, Luca, additional, Huang, Zhirong, additional, Fukasawa, Atsushi, additional, Kim, Dongsung, additional, Kutsaev, Sergey, additional, Lawler, Gerard, additional, Li, Zenghai, additional, Majernik, Nathan, additional, Manwani, Pratik, additional, Maxson, Jared, additional, Miao, Janwei, additional, Migliorati, Mauro, additional, Mostacci, Andrea, additional, Musumeci, Pietro, additional, Murokh, Alex, additional, Nanni, Emilio, additional, O’Tool, Sean, additional, Palumbo, Luigi, additional, Robles, River, additional, Sakai, Yusuke, additional, Simakov, Evgenya I., additional, Singleton, Madison, additional, Spataro, Bruno, additional, Tang, Jingyi, additional, Tantawi, Sami, additional, Williams, Oliver, additional, Xu, Haoran, additional, and Yadav, Monika, additional
- Published
- 2024
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