1. STRUCTURAL STUDY OF Se-Te-Zn SYSTEM USING XRD SPECTRA.
- Author
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Modgil, V., Sharma, P., and Rangra, V. S.
- Subjects
- *
X-ray diffraction , *CRYSTALLOGRAPHY , *POLYCRYSTALS , *CHALCOGENIDES , *OPTOELECTRONICS , *ZINC telluride , *POLYCRYSTALLINE semiconductors , *LORENTZ force , *STRUCTURAL analysis (Science) - Abstract
X-ray diffraction (XRD) analysis has been carried out on Se19Te81-xZnx (x = 0, 3, 6, 9) samples and their diffractograms are analyzed to obtain information about various crystallographic aspects. XRD traces of all samples are taken at room temperature which shows almost similar trends. These traces confirm the formation of alloys of Se19Te81-xZnx. The presence of sharp structural peaks in these XRD patterns confirmed the polycrystalline nature of the material. In all the samples the average particle size of the alloy is found to be 4.4778 μm and mean density is found to be 120.73 g/cc. [ABSTRACT FROM AUTHOR]
- Published
- 2010