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1. Electronic gap characterization at mesoscopic scale via scanning probe microscopy under ambient conditions

Author

Dian Li, Xiong Wang, Xiaoyong Mo, Edmund C. M. Tse, and Xiaodong Cui

Subjects
Science
Abstract

The nanoscale measurement of electronic bandgaps is crucial for material characterization, but it is usually performed under cryogenic conditions. Here, the authors report a scanning probe method to determine the electronic bandgap of 2D semiconductors at the nanoscale by monitoring their quantum capacitance under ambient conditions.

Published
2022
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