163 results on '"Azzam R"'
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2. Stokes-vector and Mueller-matrix polarimetry [Invited].
3. Angularly symmetric splitting of a light beam upon reflection and refraction at an air-dielectric plane boundary: comment.
4. Quasi index matching for minimum reflectance at a dielectric-conductor interface for obliquely incident p- and s-polarized light
5. Beam splitters for p-polarized light using a high-index quarter-wave layer embedded in a low-index cube prism.
6. Angularly symmetric splitting of a light beam upon reflection and refraction at an air-dielectric plane boundary.
7. Necessary and sufficient conditions for the appearance of a reflectance minimum at oblique incidence when unpolarized or circularly polarized light is reflected at a dielectric-conductor interface.
8. Difference between the Brewster angle and angle of minimum reflectance for incident unpolarized or circularly polarized light at interfaces between transparent media.
9. Dividing a light beam into two beams of orthogonal polarizations by reflection and refraction at a dielectric surface
10. Linear-to-circular polarization transformation upon optical tunneling through an embedded low-index film
11. Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si–SiO_2 interface
12. Angle of incidence of minimum reflectance of a dielectric-conductor interface for incident unpolarized or circularly polarized light.
13. Maximum reflectance difference for incident p- and s-polarized light at air-dielectric interfaces.
14. Polarization properties of corner-cube retroreflectors: theory and experiment
15. Tilted Bilayer Membranes as Wave Retardation Plates
16. Complex reflection coefficients of p- and s-polarized light at the pseudo-Brewster angle of a dielectric-conductor interface.
17. Creating an optical xyz coordinate system by using bidirectional blazing from a symmetric triangular-groove grating in a conical diffraction mount
18. In-line quarter-wave retarders for the IR that use one and three total internal reflections
19. Thin film coatings on silicon detectors for stationary reflection properties at oblique incidence
20. Diffraction Efficiency of a Grating as a Function of the State of Polarization of Incident Light
21. A Diffraction Grating Photopolarimeter
22. Novel applications of the polarization interferometer
23. Circular and near-circular polarization states of evanescent monochromatic light fields in total internal reflection.
24. Simplified design of thin-film polarizing beam splitter using embedded symmetric trilayer stack.
25. Use of two reflective photodetectors for measuring all four Stokes parameters of light
26. Reflective quarterwave and halfwave retarders based on light interference in birefringent thin films on metal substrates at normal incidence
27. Quarter-wave layers with 50% reflectance for obliquely incident unpolarized light.
28. Constraint on the incidence angle and thickness of a transparent film on an absorbing substrate to achieve a given reflectance for incident, unpolarized light
29. Analysis of depolarization associated with light scattering
30. Achromatic angle-insensitive infrared quarter-wave retarder based on total internal reflection at the Si-SiO2 interface.
31. Phase shifts that accompany total internal reflection at a dielectric-dielectric interface.
32. Principal angles and principal azimuths of frustrated total internal reflection and optical tunneling by an embedded low-index thin film.
33. Total internal reflection without change of polarization using a right-angle prism with half-wavelength-thick optical interference coating.
34. Robustness of the four-detector photopolarimeter and the general concept of polarimetric light traps
35. Photopolarimeter using two modulated optical rotators
36. Analytical determination of the complex refractive index of an opaque film deposited on a transparent substrate from the pseudo-Brewster angles of internal and external reflection
37. Current-ratio uniform-sensitivity thickness monitor (CRUST-M)
38. Binary polarization modulator: a simple device for switching light polarization between orthogonal states
39. Coated dielectric-slab beam splitter for a polarization-independent Michelson interferometer
40. Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal
41. Four-detector photopolarimeter: first experimental results
42. Reflectance of an absorbing substrate for incident light of arbitrary polarization: appearance of a secondary maximum at oblique incidence
43. Four-detector photopolarimeter: general analysis and optimization
44. Analysis of systematic errors in rotating-analyzer ellipsometers*
45. Propagation of partially polarized light through anisotropic media with or without depolarization: A differential 4 × 4 matrix calculus
46. Bare and thin film-coated substrates with maximally flat reflectance vs angle of incidence curve for incident unpolarized light
47. General Treatment of the Effect of Cell Windows in Ellipsometry*
48. Simplified Approach to the Propagation of Polarized Light in Anisotropic Media—Application to Liquid Crystals*
49. Loci of Invariant-Azimuth and Invariant-Ellipticity Polarization States of an Optical System
50. Three-dimensional polarization states of monochromatic light fields.
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