1. Regular and anomalous extraordinary optical transmission at the THz-gap
- Author
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Alexander V. Gelfand, Sergei A. Kuznetsov, M. Sorolla, I. Campillo, Miguel Beruete, V. V. Kubarev, Miguel Navarro-Cia, Universidad Pública de Navarra. Departamento de Ingeniería Eléctrica y Electrónica, and Nafarroako Unibertsitate Publikoa. Ingeniaritza Elektriko eta Elektronikoa Saila
- Subjects
Materials science ,Terahertz radiation ,Infrared Rays ,Surface Properties ,Physics::Optics ,Extraordinary optical transmission ,Polypropylenes ,law.invention ,Optics ,law ,Transmittance ,Scattering, Radiation ,Microwaves ,Plasmon ,THz-gap ,Radiation ,Anomalous extraordinary transmission ,Fourier Analysis ,business.industry ,Surface plasmon ,Signal Processing, Computer-Assisted ,Equipment Design ,Models, Theoretical ,Surface Plasmon Resonance ,Atomic and Molecular Physics, and Optics ,Refractometry ,Surface wave ,Metals ,Optoelectronics ,Near-field scanning optical microscope ,Photolithography ,business ,Terahertz Radiation - Abstract
In this paper Anomalous Extraordinary Transmission (ET) is reported for s-polarization of low loss doubly periodic subwavelength hole arrays patterned on polypropylene (PP) substrates by conventional contact photolithography at the so-called THz-gap (1-10 THz). The unexpected enhanced transmittance for s-polarization (i.e. without spoof plasmons) was previously numerically demonstrated in subwavelength slits arrays. However, subsequently no experimental work has been devoted to this unexpected Extraordinary Transmission neither in subwavelength slits nor in subwavelength holes. Here, numerical study and experimental results of the Anomalous ET and the symmetric and antisymmetric transmittance modes associated with the already well-known p-polarization ET are shown alongside a systematically analysis of the frequency peaks as a function of hole size for both incident polarizations. This work was supported by Spanish Government and E.U. Feder under contracts Consolider “Engineering Metamaterials” CSD2008-00066 and TEC2008-06871-C02-01.
- Published
- 2009