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We present a passive technique for recovering the conventional imagery of a non-line- of-sight scene using the spatial and angular components of the scattered light field along a homogeneous surface.

We develop a way to find volumetric scattering model parameter values based on measured BSDF characteristics. Example models often use Mie or Gegenbauer particles. The accuracy and flexibility of this approach are illustrated.

Angle resolved scatter measurement was performed on uncoated and AR coated CaF2. Subsurface-damage-free CaF2 and AR coatings with smoothed capping led to 4-fold and 2-fold scatter reduction when compared to the corresponding super polished CaF2.

In most applications, contamination of optical thin film coatings is inevitable over time. We demonstrate that the coating design can be tailored to reduce light scattering arising from particle contamination.

We investigate ray trace simulations of isotropic and anisotropic diffusers. Such diffusers require large data sets of highly accurate BSDF measurements that cover the range of illumination angles incident on the diffuser in the simulation.

Light scattering measurements are used to determine surface PSD functions and application-specific roughness values in different relevant spatial frequency ranges. A new method is presented for area covering investigations of the high-spatial frequency roughness.

A generalization of Peterson’s surface scatter model results in an improved capability to predict image degradation from optical surface metrology data. A new surface scatter theory for moderately rough surfaces provides the necessary BSDF data.

BSDF measurements are broadly applicable to material characterization, quality assessment, and computer modeling. The Imaging Sphere is novel optical measurement technology that allows BSDFs to be obtained quickly and accurately for a wide variety of materials.

The optical characterization of reflectance materials is usually performed by commercial spectrophotometers. Typical measurements are the specular and diffuse reflectance as function of wavelength. To better investigate the optical properties of those materials, it is useful to know their directional/hemispherical reflectance.