1. Initial observations of the femtosecond timing jitter at the European XFEL
- Author
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Max Lederer, Henry Kirkwood, T. Tanikawa, Richard Bean, Matthieu Chollet, Cedric M. S. Takem, Hauke Höppner, M. Sikorski, Guido Palmer, Tomasz Jezynski, Klaus Giewekemeyer, Jens Buck, Motoaki Nakatsutsumi, Tokushi Sato, Romain Letrun, Adrian P. Mancuso, Patrik Vagovic, Henry N. Chapman, Yoonhee Kim, Grant Mills, Jia Liu, M. Makita, Zuzana Konôpková, Alexander Pelka, T. R. Preston, Sebastian Göde, Jan Grünert, Rita Graceffa, Samuele Di Dio Cafisio, and Moritz Emons
- Subjects
Electric fields ,Refractive index ,Free electron lasers ,Physics::Optics ,02 engineering and technology ,01 natural sciences ,law.invention ,010309 optics ,Data acquisition ,Optics ,law ,0103 physical sciences ,ddc:530 ,Jitter ,Physics ,business.industry ,Resolution (electron density) ,X ray lasers ,Sorting ,021001 nanoscience & nanotechnology ,Laser ,Atomic and Molecular Physics, and Optics ,Femtosecond ,Femtosecond lasers ,0210 nano-technology ,business ,Ultrashort pulse - Abstract
Optics letters 44(7), 1650 - 1653 (2019). doi:10.1364/OL.44.001650, Intense, ultrashort, and high-repetition-rate X-ray pulses, combined with a femtosecond optical laser, allow pump-probe experiments with fast data acquisition and femtosecond time resolution. However, the relative timing of the X-ray pulses and the optical laser pulses can be controlled only to a level of the intrinsic error of the instrument which, without characterization, limits the time resolution of experiments. This limitation inevitably calls for a precise determination of the relative arrival time, which can be used after measurement for sorting and tagging the experimental data to a much finer resolution than it can be controlled to. The observed root-mean-square timing jitter between the X-ray and the optical laser at the SPB/SFX instrument at European XFEL was 308 fs. This first measurement of timing jitter at the European XFEL provides an important step in realizing ultrafast experiments at this novel X-ray source. A method for determining the change in the complex refractive index of samples is also presented., Published by OSA, Washington, DC
- Published
- 2019
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