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Your search keyword '"Shanoob Balachandran"' showing total 2 results

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1. Focused Ion Beam (FIB) based Tomography of Dislocations Using Electron Channeling Contrast Imaging (ECCI)

2. Collection of Selected Area Electron Channeling Patterns (SACP) on an FEI Helios NanoLab Scanning Electron Microscope

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