Author: "Scheller S" / Publisher: oxford university press / usa - Searchworks@Jio Institute Digital Library Search Results

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Your search keyword '"Scheller S"' showing total 5 results

Start Over Author "Scheller S" Publisher oxford university press / usa

5 results on '"Scheller S"'

1. SDD-EDS: Element Analysis of Nanostructures in TEM.

Author: Falke, M., Kaeppel, A., Scheller, S., Hahn, W., Terborg, R., Rohde, M., Ramasse, Q., Lovejoy, T.C., Dellby, N., Szilagyi, Z.S., and Krivanek, O.L.
Subjects: X-ray spectroscopy, NANOSTRUCTURED materials analysis
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. [ABSTRACT FROM PUBLISHER]
Published: 2012
Full Text: View/download PDF

2. EDS Spectrometry at Low Accelerating Voltages: Pushing the Boundaries of Nano- and Light Element Analysis with Enhanced SDD Technology.

Author: Scheller, S., Berlin, J., Salge, T., Terborg, R., and Falke, M.
Subjects: SILICON diodes, SPECTROMETRY
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012. [ABSTRACT FROM PUBLISHER]
Published: 2012
Full Text: View/download PDF

3. Recent Developments in Silicon Drift Detector Technology: Atomic to mm Scale.

Author: Falke, M, Scheller, S, Kaeppel, A, Terborg, R, Kröemer, R, Fißler, D, and Rohde, M
Subjects: X-ray spectroscopy, DETECTORS
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]
Published: 2011
Full Text: View/download PDF

4. Chemical and Structural Analysis in 3D: Combining μ-XRF, EDS, and EBSD Data Sets.

Author: Scheller, S, Berlin, J, Käppel, A, Salge, T, Falke, M, Goran, D, Nolze, G, Tagle, R, and Waldschläger, U
Subjects: ELECTRON backscattering, CHEMICAL structure
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011. [ABSTRACT FROM PUBLISHER]
Published: 2011
Full Text: View/download PDF

5. High Count Rate Standardless and Standard-Based Quantification in EDS – Practical Limits and Root Causes for Deviations in the Result.

Author: Scheller, S., Salge, T., and Terborg, R.
Subjects: SILICON diodes
Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010. [ABSTRACT FROM PUBLISHER]
Published: 2010
Full Text: View/download PDF

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