1. Through Concentration Profiling of Heterojunction Solar Cells
- Author
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D. A. Andronikov, E. I. Terukov, G Yakovlev, I. S. Shakhrai, I. A. Nyapshaev, and V. I. Zubkov
- Subjects
010302 applied physics ,Amorphous silicon ,Materials science ,Physics and Astronomy (miscellaneous) ,Silicon ,business.industry ,chemistry.chemical_element ,Heterojunction ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Electrochemistry ,01 natural sciences ,Concentration ratio ,Capacitance ,Semimetal ,Indium tin oxide ,chemistry.chemical_compound ,chemistry ,0103 physical sciences ,Optoelectronics ,0210 nano-technology ,business - Abstract
Electrochemical capacitance–voltage profiling has been used to examine heterojunction solar cells based on single-crystal silicon. Specific features of the electrochemical capacitance–voltage profiling of modern multilayer heterojunction solar cells have been analyzed. The distribution profiles of majority carriers across the whole thickness of the samples were obtained, including, for the first time, those in layers of conducting indium tin oxide.
- Published
- 2019
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