9 results on '"Mir, Salvador"'
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2. Test measures evaluation for VCO and charge pump blocks in RF PLLs
3. Defect and fault modelling of a CMOS n-diffusion photodiode
4. Digital test of a ΣΔ modulator in a mixed-signal BIST architecture
5. Behavioral modeling and simulation of a MEMS-based ultrasonic pulse-echo system
6. Self-testable CMOS thermopile-based infrared imager
7. High-thermal-impedance beams for suspended MEMS
8. Fault simulation of MEMS using HDLs
9. Fault modeling of electrostatic comb-drives for MEMS
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