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By combining previous multilayer optics design methods a multilayer mirror program has been developed to provide a versatile tool for multilayer mirror (MLM) design for the XUV range. The optimization program allows variation of the angle of incident radiation, the interface roughness and the number of different materials within the MLM structure. The possibility of optimizing the performance of the MLM using different merit functions or reflectivity profiles has been implemented and makes this program a powerful tool for the design of different multilayer devices. Polarizers have been designed by optimizing at the Brewster angle, and ratios of R s |R p around 10 3 are achieved for specific wavelengths. To select a specific line from a superimposed line and continuum spectrum from an electron impact or laser plasma source, a selective merit function is used. Applications include the calculation of Al K α and Ti K α electron impact source radiation monochromators for the use in microbeam radiation experiments. Other ideas for MLMs where the maximal reflected wavelength is dependent on the angle of incidence are currently being studied. These MLMs are planned for the use in achieving tunability of a microscope running with a continuum source.