1. X-ray spectroscopy station for sample characterization at ELI Beamlines.
- Author
-
Zymaková, A., Precek, M., Picchiotti, A., Błachucki, W., Zymak, I., Szlachetko, J., Vankó, G., Németh, Z., Sá, J., Wiste, T., and Andreasson, J.
- Subjects
X-ray spectroscopy ,X-ray emission spectroscopy ,THIN films ,WAVELENGTH measurement - Abstract
X-ray spectroscopy is a demanded tool across multiple user communities. Here we report on a new station for X-ray emission spectroscopy at the Extreme Light Infrastructure Beamlines Facility. The instrument utilizes the von Hamos geometry and works with a number of different sample types, notably including liquid systems. We demonstrate a simple and reliable method for source position control using two cameras. This approach addresses energy calibration dependence on sample position, which is a characteristic source of measurement uncertainty for wavelength dispersive spectrometers in XES arrangement. We also present a straightforward procedure for energy calibration of liquid and powder samples to a thin film reference. The developed instrumentation enabled us to perform the first experimental determination of the Kα lines of liquidized K
3 Fe(CN)6 as well as powdered and liquidized FeNH4 (SO4 )2 . Finally, we report on proof-of-principle use of a colliding jet liquid sample delivery system in an XES experiment. [ABSTRACT FROM AUTHOR]- Published
- 2023
- Full Text
- View/download PDF