1. A continuous-time delta-sigma ADC with integrated digital background calibration.
- Author
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Tan, Siyu, Miao, Yun, Palm, Mattias, Rodrigues, Joachim, and Andreani, Pietro
- Subjects
CALIBRATION ,CONTINUOUS time systems ,DELTA-sigma modulation ,ANALOG-to-digital converters ,COMPLEMENTARY metal oxide semiconductors ,SIGNAL-to-noise ratio - Abstract
This work presents a digital calibration technique in continuous-time (CT) delta-sigma ( $$\Delta \Sigma$$ ) analog to digital converter. The converter is clocked at 144 MHz with a low oversampling ratio (OSR) of only 8. Dynamic element matching is not efficient to linearize the digital to analog converter (DAC) when the OSR is very low. Therefore, non-idealities in the outermost multi-bit feedback DAC are measured and then removed in the background by a digital circuit. A third-order, four-bit feedback, single-loop CT $$\Delta \Sigma$$ converter with digital background calibration circuit has been designed, simulated and implemented in 65 nm CMOS process. The maximum simulated signal-to-noise and distortion ratio is 67.1 dB within 9 MHz bandwidth. [ABSTRACT FROM AUTHOR]
- Published
- 2016
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