1. High-resolution X-ray luminescence extension imaging.
- Author
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Ou, Xiangyu, Qin, Xian, Huang, Bolong, Zan, Jie, Wu, Qinxia, Hong, Zhongzhu, Xie, Lili, Bian, Hongyu, Yi, Zhigao, Chen, Xiaofeng, Wu, Yiming, Song, Xiaorong, Li, Juan, Chen, Qiushui, Yang, Huanghao, and Liu, Xiaogang
- Abstract
Current X-ray imaging technologies involving flat-panel detectors have difficulty in imaging three-dimensional objects because fabrication of large-area, flexible, silicon-based photodetectors on highly curved surfaces remains a challenge1–3. Here we demonstrate ultralong-lived X-ray trapping for flat-panel-free, high-resolution, three-dimensional imaging using a series of solution-processable, lanthanide-doped nanoscintillators. Corroborated by quantum mechanical simulations of defect formation and electronic structures, our experimental characterizations reveal that slow hopping of trapped electrons due to radiation-triggered anionic migration in host lattices can induce more than 30 days of persistent radioluminescence. We further demonstrate X-ray luminescence extension imaging with resolution greater than 20 line pairs per millimetre and optical memory longer than 15 days. These findings provide insight into mechanisms underlying X-ray energy conversion through enduring electron trapping and offer a paradigm to motivate future research in wearable X-ray detectors for patient-centred radiography and mammography, imaging-guided therapeutics, high-energy physics and deep learning in radiology.Using lanthanide-doped nanomaterials and flexible substrates, an approach that enables flat-panel-free, high-resolution, three-dimensional imaging is demonstrated and termed X-ray luminescence extension imaging. [ABSTRACT FROM AUTHOR]
- Published
- 2021
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