1. Radiation-Induced Processes in Wide-Gap Dielectrics.
- Author
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Barykov, I. A., Vichev, I. Yu., Zaitsev, V. I., Kanevsky, V. M., Tarakanov, I. A., and Fedorov, V. A.
- Abstract
The phenomena occurring in dielectrics (Al
2 O3 and SiO2 ) in the field of high-power soft X-ray radiation are investigated. Experimental studies are carried out at the Angara-5-1 facility, which allows a pulsed radiation power density of the source up to 5 MW/cm2 at the location of the examined samples. It is revealed that charge carriers are generated in the surface layer of the irradiated dielectric, which causes current generation in a circuit including the dielectric. A necessary condition for current generation is the presence of "hot" electrons, which provide surface conductivity. A mathematical model is proposed to describe the process of current generation in dielectrics during exposure to high-power pulsed X-ray radiation. The model is based on the joint solution of the kinetic equations for X-ray photons, photoelectrons, conduction electrons and holes in the valence band and self-consistent Maxwell's equations. In Maxwell's equations, instead of the external current of secondary charge carriers, the radiation conduction current is used. [ABSTRACT FROM AUTHOR]- Published
- 2022
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