1. Stress intensity factors and CODs defined by in-plane displacements measured by scanning electron microscopy
- Author
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C. A. Stassinakis, Pericles S. Theocaris, and V. N. Kytopoulos
- Subjects
Materials science ,Scanning electron microscope ,business.industry ,Mechanical Engineering ,In plane ,Optics ,Mechanics of Materials ,Position (vector) ,mental disorders ,Solid mechanics ,Displacement field ,Cathode ray ,General Materials Science ,business ,Stress intensity factor ,Plane stress - Abstract
A method is developed for evaluating the displacement field around the tip of a crack in a plate under plane stress or strain conditions by executing a number of measurements in this area through the scanning electron microscope. Several spots were created around the crack tip by using the electron beam of the SEM, which were used as reference points. A theory was developed which yields the components of the in-plane displacements and their differences from the coordinates of the reference spots measured through SEM. The method presents the advantage that its results are independent of the exact position of the crack tip and therefore it is suitable for performing measurements very close to this tip. Experimental evidence with plexiglas plates showed the validity of the method for defining the displacement field as well as the values of crack opening displacements and the stress intensity factor.
- Published
- 1988
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