7 results on '"Mitsuhashi, R."'
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2. Defect Profiling and the Role of Nitrogen in Lanthanum Oxide-capped High-κ Dielectrics for nMOS Applications
3. Oxygen-Vacancy-Induced Vt shift in La-containing Devices
4. Current Status and Addressing the Challenges of Hf-based Gate Stack toward 45nm-LSTP Application
5. 65nm-node Low-Standby-Power FETs with HfAlOx Gate Dielectric
6. A HfAlOx Gate Dielectric FET Technology Compatible with a Conventional Poly-Si Gate CMOS Process
7. Thermal Instability of Poly-Si Gate Al2O3 MOSFETs
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