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7 results on '"Mitsuhashi, R."'

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1. Gate Leakage Advantage of LaO Incorporation for Vt Tuning in High-k nMOSFETs over Metal Gate WF Control

3. Oxygen-Vacancy-Induced Vt shift in La-containing Devices

5. 65nm-node Low-Standby-Power FETs with HfAlOx Gate Dielectric

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