1. Structural and optical characterization of annealed As30Te60Ga10 thin films prepared by thermal evaporation technique
- Author
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Alaa M. Abd-Elnaiem, M.A. Abdel-Rahim, Mansour Mohamed, Rashed M. Hassan, M.M. Hafiz, and A.A. Abu-Sehly
- Subjects
structural properties ,optical properties ,010302 applied physics ,Materials science ,Mechanical Engineering ,02 engineering and technology ,021001 nanoscience & nanotechnology ,Condensed Matter Physics ,01 natural sciences ,as-te-ga ,Nanomaterials ,Characterization (materials science) ,chalcogenide ,thermal evaporation ,thin films ,Chemical engineering ,Mechanics of Materials ,0103 physical sciences ,TA401-492 ,General Materials Science ,Thin film ,0210 nano-technology ,Materials of engineering and construction. Mechanics of materials - Abstract
Effect of annealing temperature on the structural and optical properties of As30Te60Ga10 thin film was studied using various techniques such as differential scanning calorimetry (DSC), X-ray diffraction (XRD) and scanning electron microscopy (SEM). The DSC analysis revealed that the As30Te60Ga10 glass has a single glass transition and crystallization peak while XRD results confirmed that the as-prepared and annealed films have crystalline nature. The coexistence of the crystalline phases in the investigated films could be attributed to the formation of orthorhombic As, hexagonal Ga7Te10, and monoclinic As2Te3 phases. It was found that the average crystallite size and optical parameters of the studied films depend on the annealing temperature. For example, the optical band gap decreased from 1.54 eV to 1.11 eV as the annealing temperature increased from 300 K to 433 K.
- Published
- 2018
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