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We investigated associations of markers of inflammation such as albumin, fibrinogen, C-reactive protein (CRP), and white blood cell count (WBCC) with future weight gain and weight loss in middle-aged adults in order to further elucidate the relationship between subclinical inflammation and weight change. Data were derived from the third population-based MONICA (Monitoring of Trends and Determinants in Cardiovascular Diseases) Augsburg survey (S3) conducted as part of the multinational World Health Organization MONICA project in 1994-1995 and a follow-up examination, to which all eligible subjects from S3 were invited in 2004-2005 (F3). In total, 2,792 persons (1,391 men, 1,401 women) aged 25-74 years at baseline were analyzed. Subjects with elevated concentrations of inflammatory markers were more prone to gain weight during follow-up. The odds ratios (OR) for a large mean annual weight gain (i.e., on average 1.02 kg/year) was 1.73 (95% confidence interval (CI) 1.27, 2.35) in fully adjusted analyses for subjects in the highest compared to the lowest quartile of fibrinogen. The respective ORs were 1.45 (95% CI, 1.08, 1.94) and 1.37 (95% CI, 1.03, 1.82) for CRP and WBCC. Stratified analyses revealed that associations were strongest among subjects who quitted smoking during the follow-up period (new quitters). Associations of inflammatory markers with large mean annual weight loss were weaker and became nonsignificant after multivariable adjustment. In conclusion, elevated levels of inflammatory markers are independently associated with weight gain in middle-aged adults, particularly among new quitters. This suggests that inflammation plays a key role in the process of weight gain, especially after smoking cessation.

Geometrische Parameter wie Quellgrose und Blendengrosen, Abstande zwischen den einzelnen rontgenoptischen Komponenten und die charakteristischen Kenngrosen der strahlformenden Elemente beeinflussen die Winkel- und Energieauflosung in der experimentellen Anordnung der Rontgenreflektometrie. In Multischicht-Rontgenoptiken und Kristallmonochromatoren erfolgt die Kollimation und die Monochromatisierung entsprechend der BRAGG’schen Gleichung. Kristalle bestehen aus einem 3-dim. Gitter, in dem die streuenden Netzebenenen regelmasig angeordnet sind. Die Zahl der koharent streuenden Netzebenen ist sehr hoch. Deshalb sind Energie- und Winkelauflosung eines Kristallmonochromators um ca. eine Grosenordnung hoher als beim Multischichtsystem, welches als 1-dim. periodisches Gitter verstanden werden kann. Typisch fur eine Multischicht-Rontgenoptik ist eine Energieauflosung im Bereich ΔE/E = Δλ/λ von 10-1 bis 10-2. Demzufolge ist die Winkeldivergenz in der Grosenordnung zwischen 0.01° und 0.1° z. B. fur Cu Kα Strahlung. Allein mit Multischichtrontgenoptiken konnen Gesamtschichtdicken bis d = 270nm an Hand der Dickenoszillationen im Reflektogramm aufgelost werden. Oberhalb dieser Gesamtschichtdicke ist es erforderlich, die Winkeldivergenz durch Strahleinkopplung in einen Kristallmonochromator (CC) zu reduzieren und damit den auflosbaren Dickenbereich zu erhohen. Der Gewinn an Auflosung durch Kopplung einer Multischichtoptik und eines CC konnte am Beispiel einer 400nm Multischicht gezeigt werden. Thin film characterization by means of X-ray reflectometry X-ray reflectometry and diffractometry are widely used non-destructive methods to characterize thin films in the total thickness range which is typically between 2nm and approximately 500nm. On special arrangements a resolution up to 1000nm layer thickness has been demonstrated. Layer stack morphology, surface topography, layer structure, material density, single layer or period thickness and surface and interface roughness are the typical structural parameters both of single layers and of multilayers which can be described by the measured data. The performance of the measurement setup is mainly influenced by the parameters of the incident X-ray beam like beam divergence, monochromatism and photon energy. In the following the influence of the optical components in the beam path to angle and energy resolution of X-ray reflectometry is discussed.