1. A monolithic GaN driver with a deadtime generator (DTG) for high‐temperature (HT) GaN DC‐DC buck converters.
- Author
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Cui, Miao, Zhu, Yuhao, Cao, Pingyu, Li, Ang, Bu, Qinglei, Mitrovic, Ivona Z., Su, Xujun, Zhao, Yinchao, Wen, Huiqing, Liu, Wen, and Zhao, Cezhou
- Subjects
DC-to-DC converters ,ELECTRIC current rectifiers ,GALLIUM nitride ,MODULATION-doped field-effect transistors ,WIDE gap semiconductors - Abstract
This paper presents a monolithic GaN driver with a deadtime generator (DTG) for half‐bridge DC‐DC buck converters. The proposed GaN integrated circuits (ICs) were fabricated in a 3 µm enhancement‐mode GaN MIS‐HEMTs process. The integrated DTG converter can operate at 250°C with a large gate swing of 10 V, and it exhibits a maximum efficiency of 80% at high temperatures, with VIN= 30 V at 100 kHz. The monolithic GaN DTG driver requires one control signal and generates a deadtime of fewer than 0.13 µs at high temperatures up to 250°C. The proposed DTG converter is compared to an integrated GaN converter without DTG (w/o) under various conditions. At high temperatures, the optimized GaN DTG converter shows better performance than the GaN converter w/o at high load currents, in terms of smaller voltage overshoots and better efficiency as well. This work demonstrates a simple GaN deadtime method for high temperature (HT) GaN power converters. [ABSTRACT FROM AUTHOR]
- Published
- 2023
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