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Raman spectroscopy and Hall measurements have been carried out to investigate the differences in near-surface charge carrier modulation in high energy (~100 MeV) silicon ion (Si8+) and oxygen ion (O7+) irradiated n-GaAs. In the case of O ion irradiation, the observed decrease in carrier concentration with increase in ion fluence could be explained in the view of charge compensation by possible point defect trap centers, which can form because of elastic collisions of high energy ions with the target nuclei. In Si irradiated n-GaAs one would expect the carrier compensation to occur at a fluence of 2.5 × 1013 ions/cm2, if the same mechanism of acceptor state formation, as in case of O irradiation, is considered. However, we observe the charge compensation in this system at a fluence of 5 × 1012 ions/cm2. We discuss the role of the complex defect states, which are formed because of the interaction of the primary point defects, in determining carrier concentration in a Si irradiated n-GaAs wafer. The above results are combined with the reported data from the literature for high energy silver ion irradiated n-GaAs, in order to illustrate the effect of both electronic and nuclear energy loss on trap creation and charge compensation. Copyright © 2016 John Wiley & Sons, Ltd. [ABSTRACT FROM AUTHOR]

In this article, we report the structural phase transitions in Bi4 V2 O11 as observed from temperature-dependent Raman scattering and X-ray diffraction measurements. Four different types of highly disordered coordination polyhedra around the vanadium atoms with large dispersion of V-O bond lengths are observed in Bi4 V2 O11 at ambient temperature. The observed V-O bond lengths could be grouped into two categories, viz. shorter <1.7 Å and longer >1.7 Å. The Raman modes of Bi4 V2 O11 could be assigned to vibration of these bonds and V-O-V linkages. We could correlate the difference in degree of anharmonicity of the phonon modes with temperature to differences in V-O bond strength. The local structure of vanadium-oxygen network in Bi4 V1.8 Cu0.2 O10.7 was also obtained by similar studies. The effect of highly disordered anion sublattice in the doped compound is reflected in the broadening of the Raman modes. [ABSTRACT FROM AUTHOR]