1. Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics.
- Author
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Mimura, Hidekazu, Yamauchi, Kazuto, Yamamura, Kazuya, Kubota, Akihisa, Matsuyama, Satoshi, Sano, Yasuhisa, Ueno, Kazumasa, Endo, Katsuyoshi, Nishino, Yoshinori, Tamasaku, Kenji, Yabashi, Makina, Ishikawa, Tetsuya, and Mori, Yuzo
- Subjects
X-ray microscopes ,MIRRORS ,OPTICS ,INTERFEROMETERS ,COHERENCE (Optics) ,X-rays - Abstract
A new figure correction method has been applied in order to fabricate an elliptical mirror to realize a one-dimensionally diverging X-ray beam having high image quality. Mutual relations between figure errors and intensity uniformities of diverging X-ray beams have also been investigated using a wave-optical simulator and indicate that figure errors in relatively short spatial wavelength ranges lead to high-contrast interference fringes. By using a microstitching interferometer and elastic emission machining, figure correction of an elliptical mirror with a lateral resolution close to 0.1 mm was carried out. A one-dimensional diverging X-ray obtained using the fabricated mirror was observed at SPring-8 and evaluated to have a sufficiently flat intensity distribution. [ABSTRACT FROM AUTHOR]
- Published
- 2004
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