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A free-space method for the measurement of biaxial material is proposed in this paper. Four complex transverse constitutive parameters are directly computed from the reflection and transmission coefficients of a planar sample in free space for the normally incident plane wave with two polarizations. However, because of the extreme insensibility of the reflection and transmission coefficients versus the longitudinal constitutive parameters for thin planar biaxial materials, the correct reconstruction of longitudinal parameters cannot be accomplished by the free-space method. Considering that the principal coordinate system (PCS) to characterize biaxial material possibly does not coincide with the measurement coordinate system (MCS), an approach to determine PCS is also presented to ensure practicability of this method. A measurement system has been set up to perform measurements of transverse parameters of biaxial material and the validity of this method is experimentally verified. © 2005 Wiley Periodicals, Inc. Microwave Opt Technol Lett 46: 72–78, 2005; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.20905 [ABSTRACT FROM AUTHOR]

For in situ measurement of the complex permittivity of planar materials, a free-space system based on reflection or transmission ellipsometry has been developed and extended to microwave frequencies. Different angles of incidence were studied in the range [35–50°]. Original numerical methods based on contour-line charts and least-square optimization have been developed. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 443–448, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10346 [ABSTRACT FROM AUTHOR]

Free-space method approaches for obtaining the complex permittivity of dielectric layers embedded in a multilayer dielectric material are investigated. Solids, liquids, and granular materials have been tested; a description of the de-embedding process is presented in detail, as are the measured permittivity values. © 2002 Wiley Periodicals, Inc. Microwave Opt Technol Lett 33: 422–426, 2002; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.10340 [ABSTRACT FROM AUTHOR]

A simple and efficient method for determining the complex permittivity of dielectric materials from both reflected and transmitted signals is presented. It is also novel because the technique is implemented using two pyramidal horns without any focusing mechanisms. The dielectric constant of a noninteractive and distributive (NID) mixture of dielectrics is also determined. © 2000 John Wiley & Sons, Inc. Microwave Opt Technol Lett 26: 117–119, 2000. [ABSTRACT FROM AUTHOR]

The complex permittivity of low-loss dielectric materials (ABS and graft polymer) in the 94 GHz band is measured using the free-space method. The validity of the free-space method at 94 GHz is confirmed, and the data of the complex permittivity of these materials are presented. ©1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 22: 291–292, 1999. [ABSTRACT FROM AUTHOR]