1. Pulse-Mode Dynamic Ron Measurement of Large-Scale High-Power AlGaN/GaN HFET.
- Author
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Minki Kim, Youngrak Park, Junbo Park, Dong Yun Jung, Chi-Hoon Jun, and Sang Choon Ko
- Subjects
ELECTRIC power conversion ,ENERGY conversion ,CONVERTERS (Electronics) ,GALLIUM arsenide - Abstract
We propose pulse-mode dynamic R
on measurement as a method for analyzing the effect of stress on large-scale high-power AlGaN/GaN HFETs. The measurements were carried out under the soft-switching condition (zero-voltage switching) and aimed to minimize the self-heating problem that exists with the conventional hard-switching measurement. The dynamic Ron of the fabricated AlGaN/GaN MIS-HFETs was measured under different stabilization time conditions. To do so, the drain-gate bias is set to zero after applying the off-state stress. As the stabilization time increased from 0.1 μs to 100 ms, the dynamic Ron decreased from 160 Ω to 2 Ω. This method will be useful in developing high-performance GaN power FETs suitable for use in high-efficiency converter/inverter topology design. [ABSTRACT FROM AUTHOR]- Published
- 2017
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