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The most popular method to determine the sensitivity of surface plasmon resonance (SPR) sensors in the last couple of decades has been angular interrogation. The silver layer (Ag), a 2D layer of TiO2, and dielectric material layer such as silicon (Si) with heterostructure material graphene are all stacked in the proposed SPR sensor. To increase sensitivity of SPR sensor in the visible area, the device structure focuses on the Kretschmann configuration, by which a TiO2 sheet is sandwiched between silver and silicon sheets. The proposed device structure makes use of the operational wavelength of 633 nm. The numerical simulation has been performed in MATLAB software in this device structure. The simulation results show that an analyte of refractive indices ranges 1.345–1.350. A single layer of silicon 3 nm and TiO2 10 nm makes up the suggested SPR configuration, which increases the sensitivity to 281° RIU−1. Herein, it has also been computed the figure of merit, detection accuracy, limit of detection, full width at half maximum, and transverse magnetic electric field intensity. The biomedical and chemical fields have benefited from the proposed SPR sensor structure design. [ABSTRACT FROM AUTHOR]

A Kretschmann configuration‐based surface plasmon resonance sensor is proposed. The sensor is made up of calcium fluoride prism, silver, silicon, and tungsten di selenide nanolayer. The theoretical and numerical study of surface plasmon resonance sensor is analyzed by angle interrogation method with the help of MATLAB 2017b. The transfer matrix method (TMM) is the foundation for simulation and a monochromatic light of wavelength 633 nm is considered as source. In the proposed device structure, each layer is arranged in vertical format to improve the electrical and optical properties. The refractive index for analyte is considered as 1.330 to 1.335. Silver (Ag) metal is used for the generation of surface plasmons. It has good chemical properties like metallic conductivity, chemical stability, bandgap, small work function, and acts as an adhesive layer between calcium fluoride prism and silicon layer. To improve the molecular contact and absorption, the transition metal dichalcogenide nanofilm tungsten di selenide (WSe2) is applied at the top. The sensitivity of 367.4 deg RIU−1, detection accuracy of 0.4169 deg−1, quality factor of 193.58, and full‐width half maximum of 1.8985 deg are obtained optimized performance parameters of the proposed device structure. [ABSTRACT FROM AUTHOR]