1. Effect of the Annealing Temperature on the Electronic and Atomic Structures of Exchange-Biased NiFe–FeMn Bilayers.
- Author
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Lee, J. M., Jan, J. C., Chiou, J. W., Pong, W. F., Tsai, M.-H., Chang, Y. K., Chen, Y. Y., Wang, C. R., Lee, J. F., Yang, T., Lu, Z., Lai, W. Y., and Mai, Z. H.
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X-ray absorption near edge structure ,THIN films - Abstract
In this study we measured the Fe, Mn, and Ni L[sub 2,3]-edge X-ray absorption near-edge structure (XANES) and K-edge extended X-ray absorption fine structure (EXAFS) of the ferromagnetic (FM) NiFe and antiferromagnetic (AFM) FeMn bilayer films prepared with various annealing temperatures. The branching ratios of the white-line intensities in the Fe, Mn, and Ni L[sub 2,3]-edges XANES spectra and consequently the magnetic properties of these exchange-biased FM NiFe — AFM FeMn bilayers are found to depend strongly on the annealing temperature. We find that the first peak in the Fe, Mn, and Ni K-edge EXAFS Fourier transform spectra are very similar, which suggests that the nearest-neighbor bond lengths among Fe, Mn, and Ni atoms are essentially the same in the NiFe-FeMn bilayers. However, the peaks at distances greater than ∼ 3 Å appear to be sensitive to the annealing temperature especially for the Fe and Mn K-edge spectra, which suggests that annealing alters the atomic structures of the next-nearest-neighbor and more distant shells surrounding the Fe and Mn atoms in the NiFe-FeMn bilayers. [ABSTRACT FROM AUTHOR]
- Published
- 2002
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