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3. High-speed free-run ptychography at the Australian Synchrotron

Author

Jones, Michael, van Riessen, Grant, Phillips, Nicholas W., Schrank, Christoph, Hinsley, Gerard, Afshar, Nader, Reinhardt, Juliane, de Jonge, Martin D., Kewish, Cameron M., Jones, Michael, van Riessen, Grant, Phillips, Nicholas W., Schrank, Christoph, Hinsley, Gerard, Afshar, Nader, Reinhardt, Juliane, de Jonge, Martin D., and Kewish, Cameron M.

Abstract

Over the last decade ptychography has progressed rapidly from a specialist ultramicroscopy technique into a mature method accessible to non-expert users. However, to improve scientific value ptychography data must reconstruct reliably, with high image quality and at no cost to other correlative methods. Presented here is the implementation of high-speed ptychography used at the Australian Synchrotron on the XFM beamline, which includes a free-run data collection mode where dead time is eliminated and the scan time is optimized. It is shown that free-run data collection is viable for fast and high-quality ptychography by demonstrating extremely high data rate acquisition covering areas up to 352 000 µm2 at up to 140 µm2 s−1, with 13× spatial resolution enhancement compared with the beam size. With these improvements, ptychography at velocities up to 250 µm s−1 is approaching speeds compatible with fast-scanning X-ray fluorescence microscopy. The combination of these methods provides morphological context for elemental and chemical information, enabling unique scientific outcomes.

Published
2022

4. High-speed free-run ptychography at the Australian Synchrotron

Author

Jones, Michael W. M., primary, van Riessen, Grant A., additional, Phillips, Nicholas W., additional, Schrank, Christoph E., additional, Hinsley, Gerard N., additional, Afshar, Nader, additional, Reinhardt, Juliane, additional, de Jonge, Martin D., additional, and Kewish, Cameron M., additional

Published
2022
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6. The XFM beamline at the Australian Synchrotron

Author

Howard, Daryl L., primary, de Jonge, Martin D., additional, Afshar, Nader, additional, Ryan, Chris G., additional, Kirkham, Robin, additional, Reinhardt, Juliane, additional, Kewish, Cameron M., additional, McKinlay, Jonathan, additional, Walsh, Adam, additional, Divitcos, Jim, additional, Basten, Noel, additional, Adamson, Luke, additional, Fiala, Tom, additional, Sammut, Letizia, additional, and Paterson, David J., additional

Published
2020
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8. Spiral scanning X-ray fluorescence computed tomography

Author

de Jonge, Martin D., primary, Kingston, Andrew M., additional, Afshar, Nader, additional, Garrevoet, Jan, additional, Kirkham, Robin, additional, Ruben, Gary, additional, Myers, Glenn R., additional, Latham, Shane J., additional, Howard, Daryl L., additional, Paterson, David J., additional, Ryan, Christopher G., additional, and McColl, Gawain, additional

Published
2017
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9. Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Author

Jones, Michael, Phillips, Nicholas, Van Riessen, Grant, Abbey, Brian, Vine, David, Nashed, Youssef, Mudie, Stephen, Afshar, Nader, Kirkham, Robin, Chen, Bo, Balaur, Eugeniu, de Jonge, Martin, Jones, Michael, Phillips, Nicholas, Van Riessen, Grant, Abbey, Brian, Vine, David, Nashed, Youssef, Mudie, Stephen, Afshar, Nader, Kirkham, Robin, Chen, Bo, Balaur, Eugeniu, and de Jonge, Martin

Abstract

Free to read Owing to its extreme sensitivity, quantitative mapping of elemental distributions via X-ray fluorescence microscopy (XFM) has become a key microanalytical technique. The recent realisation of scanning X-ray diffraction microscopy (SXDM) meanwhile provides an avenue for quantitative super-resolved ultra-structural visualization. The similarity of their experimental geometries indicates excellent prospects for simultaneous acquisition. Here, in both step- and fly-scanning modes, robust, simultaneous XFM-SXDM is demonstrated.

Published
2016

10. Simultaneous X-ray fluorescence and scanning X-ray diffraction microscopy at the Australian Synchrotron XFM beamline

Author

Jones, Michael W. M., primary, Phillips, Nicholas W., additional, van Riessen, Grant A., additional, Abbey, Brian, additional, Vine, David J., additional, Nashed, Youssef S. G., additional, Mudie, Stephen T., additional, Afshar, Nader, additional, Kirkham, Robin, additional, Chen, Bo, additional, Balaur, Eugeniu, additional, and de Jonge, Martin D., additional

Published
2016
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11. A new approach to system reliability

Author

Chaudhuri, Gopal, Hu, Kuolung, and Afshar, Nader

Subjects
Accelerated life testing -- Models, Algorithms -- Usage, Business, Electronics, Electronics and electrical industries
Abstract

A C-H-A algorithm is presented based on a knowledge of path sets of a given structure with regard to system reliability.

Published
2001

12. Tandem probe analysis mode for synchrotron XFM: doubling throughput capacity

Author

Casey L. Doolette, Daryl L. Howard, Nader Afshar, Cameron M. Kewish, David J. Paterson, Jianyin Huang, Stefan Wagner, Jakob Santner, Walter W. Wenzel, Tom Raimondo, Alexander T. De Vries Van Leeuwen, Lei Hou, Frederik van der Bom, Han Weng, Peter M. Kopittke, Enzo Lombi, Doolette, Casey L, Howard, Daryl L., Afshar, Nader, Kewish, Cameron M, Paterson, David J, Huang, Jianyin, Wagner, Stefan, Santner, Jakob, Wenzel, Walter W, Raimondo, Tom, De Vries Van Leeuwen, Alexander T, Hou, Lei, Van Der Bom, Frederik, Weng, Han, Kopittke, Peter M, and Lombi, Enzo

Subjects
Polyurethanes, sediments, fluorescence spectroscopy, gels, fluorescence microscopy, rivers, Analytical Chemistry, Diffusion, amides, Soil, scanning, materials handling, laser ablation, fluorescence, mapping, probes, Gels, soils, Synchrotrons, Uncategorized, mass spectrometry
Abstract

Synchrotron-based X-ray fluorescence microscopy (XFM) analysis is a powerful technique that can be used to visualize elemental distributions across a broad range of sample types. Compared to conventional mapping techniques such as laser ablation inductively coupled plasma mass spectrometry or benchtop XFM, synchrotron-based XFM provides faster and more sensitive analyses. However, access to synchrotron XFM beamlines is highly competitive, and as a result, these beamlines are often oversubscribed. Therefore, XFM experiments that require many large samples to be scanned can penalize beamline throughput. Our study was largely driven by the need to scan large gels (170 cm2) using XFM without decreasing beamline throughput. We describe a novel approach for acquiring two sets of XFM data using two fluorescence detectors in tandem; essentially performing two separate experiments simultaneously. We measured the effects of tandem scanning on beam quality by analyzing a range of contrasting samples downstream while simultaneously scanning different gel materials upstream. The upstream gels were thin (99%) transmittance with minimal (

Published
2022

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