6 results on '"Haendler, S."'
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2. Self-Heating Effect in FDSOI Transistors Down to Cryogenic Operation at 4.2 K
3. Impact of low‐frequency noise variability on statistical parameter extraction in ultra‐scaled CMOS devices
4. Impact of dynamic variability on the operation of CMOS inverter
5. Low-Frequency Noise Investigation and Noise Variability Analysis in High- $k$/Metal Gate 32-nm CMOS Transistors
6. Low-Frequency Noise Investigation and Noise Variability Analysis in High- k/Metal Gate 32-nm CMOS Transistors.
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