1. Surface Characteristics of Epitaxial Sr2FeMoO6 Thin Films
- Author
-
Hidefumi Asano, N. Koduka, K. Imaeda, Masaaki Matsui, and Y. Takahashi
- Subjects
Surface (mathematics) ,Materials science ,Photoemission spectroscopy ,Atomic force microscopy ,Analytical chemistry ,Condensed Matter Physics ,Epitaxy ,Spectral line ,Electronic, Optical and Magnetic Materials ,Metal ,X-ray photoelectron spectroscopy ,visual_art ,visual_art.visual_art_medium ,Electrical and Electronic Engineering ,Thin film ,Instrumentation - Abstract
Thin films of ordered double perovskite Sr2FeMoO6 were sputter-deposited on Ba0.4Sr0.6TiO3-buffered SrTiO3 substrates, and their surface properties were examined by atomic force microscopy (AFM) and X-ray photoemission spectroscopy (XPS). The Mo 3d spectra of Sr2FeMoO6 films showed a multiple peak structure, which originated from the unusual electronic state of metallic Sr2FeMoO6. Systematic XPS studies of the air-exposed surface of Sr2FeMoO6 film indicated that the surface native barrier was an insulating SrMoO4. In addition, a TMR junction with the native barrier was fabricated using a convention photolithographic technique, and an MR ratio of 10 % was observed at 4.2 K.
- Published
- 2006
- Full Text
- View/download PDF