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With the development of the power industry and the increase in the capacity of power systems, vacuum switches have been developed rapidly. The distribution characteristics of the vacuum arc can reflect the working conditions of the vacuum switch. So, it is vital to understand the distribution characteristics in the vacuum arc burning process for understanding the interruption performance of vacuum switches. Based on the 3D magnetohydrodynamic model, we investigated the high-current vacuum arc burning process by modeling and numerical simulation. The research findings show a certain correspondence between the change in plasma parameters values and the change in arc current. The distribution of plasma parameters is uniform when the current is small. The distribution of plasma parameters in the first 1/4 cycle is more uniform than in the second 1/4 cycle. The evolution characteristics of the arc plasma parameters for interruption before the arc current maximum differ significantly from those for interruption after the arc current maximum and current maximum. The results of this study can provide a reference for the design and improvement of vacuum switches. [ABSTRACT FROM AUTHOR]

When short current is interrupted in three-phase vacuum interrupter in switchgear, the “U”-type loop composed of external busbar, conductive rod, and vacuum interrupter, and its adjacent phases will generate external actual transverse magnetic field (EATMF) in the interrupter. The existence of EATMF will deflect the vacuum arc, which will affect the breaking performance of vacuum switch. In view of this situation, this article establishes two kinds of electrode system simulation models considering and not considering EATMF. The simulation results show that EATMF is not uniformly distributed in the interelectrode region, but is stronger in the contact cup edge area outside the “U”-type loop, weaker in the “U”-type loop, and mainly affects ${B} _{x}$. In different short-circuit cases, EATMF is also different due to the difference of phase distance and short current. In the case of three-phase short circuit, the magnetic field in the interelectrode region of the middle phase is most significantly affected by EATMF. EATMF is closely related to the structure size of vacuum switch. By changing the structure size of vacuum switch (e.g., phase spacing ${d}$ , conductive rod length ${h} _{1}$ , ${h} _{2}$), EATMF can be weakened to some extent. [ABSTRACT FROM AUTHOR]