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Abstract: Advanced polychromatic microdiffraction is sensitive to the organization of dislocations and other defects that rotate the lattice planes. Using ultra-brilliant third-generation synchrotron sources and non-dispersive X-ray focusing optics, it is now possible to analyze individual dislocation cells and walls at a submicron scale that cannot be probed by traditional methods. The method is applied to an Ir weld sample to illustrate how microdiffraction can be used to determine the locally active dislocation system. [Copyright &y& Elsevier]

Describes the three-dimensional X-ray microscopy technique using polychromatic synchrotron X-ray microbeams to probe local crystal structure. Application of the technique to single-crystal, composite and functionally graded materials; Development of X-ray microscopy technique; Extraction of complete Laue diffraction patterns by using the technique.