Search

Deep-level luminescence at 3.3 eV related to the presence of Al vacancies (V Al ) was observed in room temperature photoluminescence (RT-PL) spectra of homoepitaxial AlN layers grown at 1450 °C by hydride vapor-phase epitaxy (HVPE) and cooled to RT in a mixture of H 2 and N 2 with added NH 3 . However, this luminescence disappeared after removing the near surface layer of AlN by polishing. In addition, the deep-level luminescence was not observed when the post-growth cooling of AlN was conducted without NH 3 . Secondary ion mass spectrometry (SIMS) studies revealed that although the point defect density of the interior of the AlN layers remained low, the near surface layer cooled in the presence of NH 3 was contaminated by Si impurities due to both suppression of the surface decomposition by the added NH 3 and volatilization of Si by decomposition of the quartz reactor walls at high temperatures. The deep-level luminescence reappeared after the polished AlN wafers were heated in presence of NH 3 at temperatures above 1400 °C. The surface contamination by Si is thought to generate V Al near the surface by lowering their formation energy due to the Fermi level effect, resulting in deep-level luminescence at 3.3 eV caused by the shallow donor (Si) to V Al transition.

Unintentionally doped n-type beta -Ga2O3 becomes highly resistive after annealing at high temperatures in oxygen ambient. The annealing process also induces an electron paramagnetic resonance (EPR) center, labeled IR1, with an electron spin of S=1/2 and principal g-values of g(xx)=2.0160, g(yy)=2.0386, and g(zz)=2.0029 with the principal axis of g(zz) being 60 degrees from the [001](*) direction and g(yy) along the b-axis. A hyperfine (hf) structure due to the hf interaction between the electron spin and nuclear spins of two equivalent Ga atoms with a hf splitting of similar to 29G (for Ga-69) has been observed. The center can also be created by electron irradiation. Comparing the Ga hf constants determined by EPR with corresponding values calculated for different Ga vacancy-related defects, the IR1 defect is assigned to the double negative charge state of either the isolated Ga vacancy at the tetrahedral site (V-Ga(I)(2-)) or the V-Ga(I)-Ga-ib-V-Ga(I) complex. Funding Agencies|DFGGerman Research Foundation (DFG) [FR2833/63-1]; HLRN [hbc00027]; Institute of Global Innovation Research, Tokyo; University of Agriculture and Technology, Japan

We employ an eigenpolarization model including the description of direction dependent excitonic effects for rendering critical point structures within the dielectric function tensor of monoclinic b ...

The isotropic average conduction band minimum electron effective mass in Sn-doped monoclinic single crystal beta-Ga2O3 is experimentally determined by the mid-infrared optical Hall effect to be (0.2846 +/- 0.013)m(0) combining investigations on (010) and ((2) over bar 01) surface cuts. This result falls within the broad range of values predicted by theoretical calculations for undoped beta-Ga2O3. The result is also comparable to recent density functional calculations using the Gaussian-attenuation-Perdew-Burke-Ernzerhof hybrid density functional, which predict an average effective mass of 0.267m(0). Within our uncertainty limits, we detect no anisotropy for the electron effective mass, which is consistent with most previous theoretical calculations. We discuss upper limits for possible anisotropy of the electron effective mass parameter from our experimental uncertainty limits, and we compare our findings with recent theoretical results. Published by AIP Publishing. Funding Agencies|Swedish Research Council (VR) [2013-5580, 2016-00889]; Swedish Governmental Agency for Innovation Systems (VINNOVA) under the VINNMER international qualification program [2011-03486]; Swedish Government Strategic Research Area in Materials Science on Functional Materials at Linkoping University, Faculty Grant SFO Mat LiU [2009 00971]; Swedish Foundation for Strategic Research (SSF) [FL12-0181, RIF14-055]; University of Nebraska-Lincoln; J. A. Woollam Co., Inc.; J. A. Woollam Foundation; National Science Foundation [MRSEC DMR 1420645, CMMI 1337856, EAR 1521428]

We report on optical studies of exciton localization and recombination kinetics in two single 2.2 nm thick AlxGa1-xN/Alx+0.1Ga0.9-xN quantum well structures (x = 0.55 and 0.6) grown by plasma assisted molecular beam epitaxy on a c-sapphire substrate. Strong localization potential inherent for both the quantum well and barrier regions results in merging of the quantum well and barrier emission spectra into a single broad line centered at 285 nm (x = 0.55) and 275 nm (x = 0.6). Time-resolved photoluminescence measurements revealed surprising temperature stability of the photoluminescence decay time constant (approximate to 400 ps) relevant to the recombination of the quantum well localized excitons. This observation implies nearly constant quantum efficiency of the quantum well emission in the whole range from 4.6 to 300 K.

We derive a dielectric function tensor model approach to render the optical response of monoclinic and triclinic symmetry materials with multiple uncoupled infrared and farinfrared active modes. We apply our model approach to monoclinic $\beta$-Ga$_2$O$_3$ single crystal samples. Surfaces cut under different angles from a bulk crystal, (010) and ($\bar{2}$01), are investigated by generalized spectroscopic ellipsometry within infrared and farinfrared spectral regions. We determine the frequency dependence of 4 independent $\beta$-Ga$_2$O$_3$ Cartesian dielectric function tensor elements by matching large sets of experimental data using a point by point data inversion approach. From matching our monoclinic model to the obtained 4 dielectric function tensor components, we determine all infared and farinfrared active transverse optic phonon modes with $A_u$ and $B_u$ symmetry, and their eigenvectors within the monoclinic lattice. We find excellent agreement between our model results and results of density functional theory calculations. We derive and discuss the frequencies of longitudinal optical phonons in $\beta$-Ga$_2$O$_3$. We derive and report density and anisotropic mobility parameters of the free charge carriers within the tin doped crystals. We discuss the occurrence of longitudinal phonon plasmon coupled modes in $\beta$-Ga$_2$O$_3$ and provide their frequencies and eigenvectors. We also discuss and present monoclinic dielectric constants for static electric fields and frequencies above the reststrahlen range, and we provide a generalization of the Lyddane-Sachs-Teller relation for monoclinic lattices with infrared and farinfrared active modes. We find that the generalized Lyddane-Sachs-Teller relation is fulfilled excellently for $\beta$-Ga$_2$O$_3$., Comment: 18 pages, 12 figures, 105 references; Presented at IWGO 2015 Nov. 4th, Kyoto, Japan

Electron paramagnetic resonance was used to study the donor that is responsible for the n-type conductivity in unintentionally doped (UID) beta-Ga2O3 substrates. We show that in as-grown materials, the donor requires high tempeature annealing to be activated. In partly activated materials with the donor concentration in the 10(16) cm(-3) range or lower, the donor is found to behave as a negative-U center (often called a DX center) with the negative charge state DX- lying similar to 16-20 meV below the neutral charge state d(0) (or E-d), which is estimated to be similar to 28-29 meV below the conduction band minimum. This corresponds to a donor activation energy of E-a similar to 44-49 meV. In fully activated materials with the donor spin density close to similar to 1 x 10(18) cm(-3), donor electrons become delocalized, leading to the formation of impurity bands, which reduces the donor activation energy to E-a similar to 15-17 meV. The results clarify the electronic structure of the dominant donor in UID beta-Ga2O3 and explain the large variation in the previously reported donor activation energy. Published by AIP Publishing. Funding Agencies|Linkoping Linnaeus Initiative for Novel Functional Materials (LiLi-NFM); Council for Science, Technology and Innovation (CSTI); Cross-ministerial Strategic Innovation Promotion Program (SIP); NEDO, Japan

Measurements of the optical Hall effect in naturally doped high-quality wurtzite-structure InN thin films by generalized ellipsometry reveal that both the surface and the interior (bulk) free electron densities decrease with powerlaw dependencies on the film thickness. We discover a significant deviation between the bulk electron and dislocation densities. This difference is attributed here to the existence of surface defects with activation mechanism different from bulk dislocations and identifies the possible origin of the so far persistent natural n-type conductivity in InN. We further quantify the anisotropy of the C-point effective mass.

Experimental and computation results based on chemical composition assessment of metal-organic chemical vapour deposition grown undoped GaN/AlxGa1-xN multiquantum well structures in the low composition limit of x = 0.07 and wide wells demonstrate composition fluctuations in the barrier layers which lead to large-scale nonuniformities and inequivalence of the different wells. As a consequence the experimental photoluminescence spectra at low temperature show a double peak structure indicative of well-width fluctuations by one lattice parameter (2 monolayers).

7 páginas, 5 figuras.-- PACS numbers: 78.67.Hc, 71.55.Eq, 73.50.Gr, It is demonstrated that the microphotoluminescence (μPL) spectrum of a single InAs/GaAs self-assembled quantum dot (QD) undergoes considerable changes when the primary laser excitation is complemented with an additional infrared laser. The primary laser, tuned slightly below the GaAs band gap, provides electron-hole pairs in the wetting layer (WL), as well as excess free electrons from ionized shallow acceptors in the GaAs barriers. An additional IR laser with a fixed energy well below the QD ground state transition generates excess free holes from deep levels in GaAs. The excess electron and hole will experience diffusion separately, due to the time separation between the two events of their generation, to eventually become captured into the QD. Although the generation rates of excess carries are much lower than that of the electron-hole pair generation in the WL, they considerably influence the QD emission at low temperatures. The integrated PL intensity increases by several times as compared to single-laser excitation, and the QD exciton spectrum is redistributed in favor of a more neutral charge configuration. The dependence of the observed phenomenon on the powers of the two lasers and the temperature has been studied and is consistent with the model proposed. The concept of dual excitation could be successfully applied to different low-dimensional semiconductor structures in order to manipulate their charge state and emission intensity., This work was supported by grants from the Swedish Foundation for Strategic Research (SSR) and Swedish Research Council (VR). Financial support from the Wenner-Gren Foundation and the program “Low- Dimensional Quantum Structures” of the Russian Academy of Sciences is acknowledged by E.S.M. V.D. is thankful for financial support from the Swedish Foundation for International Cooperation in Research and Higher Education (STINT) and from the Bulgarian National Science Fund.

The strain distribution in thick hydride vapor-phase epitaxial (HVPE)-GaN layers grown on metal-organic vapor-phase epitaxial GaN templates was studied by means of photoluminescence, x-ray mapping, and lattice parameter analysis. A variable temperature x-ray study of the film curvature was used for verification of the strain type. The relation between the strain inhomogeneity and the wafer bending in films residing on sapphire and freestanding on the thickness of the layer and the substrate is analyzed. Possibilities to improve the uniformity of the film characteristics and to reduce the bending of the HVPE-GaN films are discussed.

We report on a comparative study of defect and emission distributions in thick hydride vapor phase epitaxial (HVPE) GaN films grown on two different patterned template structures separately produced by multi-step procedures using metalorganic vapor phase epitaxy (MOVPE). The observed differences in the microstructures and emission distributions at the early stages of the growth in both cases were related to the change of the dominating growth mode sequence and point defects incorporation. Both template structures were found to favor formation of voids in the coalescence regions, which leads to a partial strain relaxation and allows overgrowth of thicker films without cracks.

(a) Linko¨ping University, 581 83 Linko¨ping, Sweden(b) Macquarie University, Sydney 2109 NSW, Australia(c) Chalmers University of Technology, 412 96 Go¨teborg, Sweden(d) Faculty of Physics, Sofia University, Sofia, Bulgaria(Submitted July 22, 2002; accepted October 1, 2002)PACS: 61.10.Eq; 68.55.Jk; 78.55.Cr; 78.60.HkWe report a study of the physical properties of free-standing HVPE-GaN quasi-substrates. A vari-ety of characterization techniques was employed in order to characterise in a comparative way thetwo sides of the films. The as-grown Ga-face was found to have lower density of both, structuraland impurity defects. This leads to a lower concentration of free carriers and residual strain in theGa-face compared to that in the N-face. The optical properties were found to be strongly influ-enced by the specific defect structure in both faces.

Origin of a fast component of the photoluminescence (PL) decay of Mn 2+ intra-shell 4T1 ? 6A 1 transition in bulk and quantum dot structures is discussed based on the results of PL, PL kinetics and ...

Jacques was born in Chernihiv, Ukraine, on 23 November 1922. A year later he and his family immigrated to Constantinople, and the following year they moved to Marseilles, France. After the Nazis oc ...

Photoluminescence (PL) properties are reported for a set of m-plane GaN films with Mg doping varied from mid 10(18) cm(-3) to above 10(20) cm(-3). The samples were grown with MOCVD at reduced press ...

We study the structural and free-charge carrier properties of two sets of InN films grown by molecular beam epitaxy doped with different Mg concentrations from 1x1018 cm-3 to 3.9x1021 cm-3. We determine the effect of Mg doping on surface morphology, lattice parameters, structural characteristics and carrier properties. We show that infrared spectroscopic ellipsometry can be used to evidence successful p-type doping in InN, which is an important issue in InN. High resolution X-ray diffraction, combined with atomic force microscopy measurements reveals a drastic decrease in structural quality of the film for Mg concentrations above 1020 cm-3, accompanied with a significant increase in surface roughness. In addition, a decrease of the c-lattice parameter and an increase of the a-lattice parameter are found with increasing Mg concentration. Different contributions to the strain are discussed and it is suggested that the incorporation of Mg leads to a change of growth mode and generation of tensile growth strain. At high Mg concentrations zinc-blende InN inclusions appear which are suggested to originate from higher densities of stacking faults. Infrared spectroscopic ellipsometry analysis shows a reduced LPP-coupling, manifested as a characteristic dip in the IRSE data, and qualitatively different broadening behavior for Mg concentrations between 1.1x1018 cm−3 and 2.9x1019 cm−3 indicate the existence of a p-type conducting bulk InN layer for these Mg concentrations.

Freestanding bulk C-doped GaN wafers grown by halide vapor phase epitaxy are studied by optical spectroscopy and electron microscopy. Significant changes of the near band gap (NBG) emission as well as an enhancement of yellow luminescence have been found with increasing C doping from 5 × 1016 cm−3 to 6 × 1017 cm−3. Cathodoluminescence mapping reveals hexagonal domain structures (pits) with high oxygen concentrations formed during the growth. NBG emission within the pits even at high C concentration is dominated by a rather broad line at ∼3.47 eV typical for n-type GaN. In the area without pits, quenching of the donor bound exciton (DBE) spectrum at moderate C doping levels of 1–2 × 1017 cm−3 is observed along with the appearance of two acceptor bound exciton lines typical for Mg-doped GaN. The DBE ionization due to local electric fields in compensated GaN may explain the transformation of the NBG emission.

It is demonstrated that the photoluminescence spectra of single self-assembled quantum dots are very sensitive to the experimental conditions, such as excitation energy and crystal temperature. A q ...

6 páginas, 4 figuras.-- PACS: 78.55.−m; 71.35.−y; 73.20.Dx; 78.66.Fd.-- Trabajo presentado en el 13th International Conference on the Electronic Properties of Two-Dimensional Systems (EP2DS), Otawa del 1 al 6 de 1999., An experimental evidence of Auger-like excitation processes in InAs/GaAs quantum dots is demonstrated. Photoluminescence spectra of resonantly excited dots exhibit a rich satellite structure below the ground-state emission band. The energy position and the intensity distribution of the satellites are analyzed and an interpretation of the satellites as due to shake-up processes of the interacting carriers in the higher quantum dot states is suggested.

Photoluminescence (PL) spectroscopy is employed to determine the nature of a near-infrared PL emission with a no-phonon line at ∼0.88 eV, commonly present in electron-irradiated GaN. This PL emission is suggested to originate from an internal transition between a moderately shallow excited state (with an ionization energy ∼21 meV) and the deep ground state (with an ionization energy ∼900 meV) of a deep defect. The existence of a higher-lying second excited state related to the 0.88-eV PL center is also shown from temperature-dependent studies. A different electronic character of the wave functions related to the first and second excited states has been revealed by PL polarization measurements. Since the PL emission has been observed with comparable intensity in all electron-irradiated GaN samples independent of doping on the starting material, it is proposed that either native defects, or common residual contaminants or their complexes are involved. The substitutional ON donor (or related complex) is considered as the most probable candidate, based on the observed striking similarity in the local vibrational properties between the 0.88-eV PL centers and the substitutional OP donor in GaP.

The crystal structure and surface morphology of hydride vapour phase epitaxy grown thick (12-105 μm) GaN layers have been investigated as a function of growth rate using several structure sensitive techniques like atomic force microscopy (AFM), x-ray diffraction (XRD) in ω-2Θ and ω-rocking curve measurements as well as low temperature photoluminescence (PL). PL and XRD measurements reveal rather narrow lines: full width at half maximum (FWHM) values of the strongest donor-bound exciton line are in the range from 6.0 to1.8 meV and ω-2Θ FWHM values are between 80 and 23 arcsec indicating good structural quality of the films. The ω-rocking curves show a single peak for the thinnest films with a FWIM of 250 arcsec and multiple peaks with FWHIM of about 250-350 arcsec in thicker films indicating the formation of several high-quality domains when increasing either thickness or growth rate. Optical microscopy and AFM images reveal a domain type of morphology and also show an appearance of spiral hillocks in layers grown at growth rates exceeding a critical value. We interpret these results as dominating 2D multilayer growth at low growth rates, and competing 2D multilayer and spiral growth mechanisms at high growth rates.

We have developed a method to modulate the strain state (normally > 4 kbar, tensile) of moderately thick (∼2 μm) GaN based structures grown on 6H-SiC to a range 0 to -2 kbar of compressive stresses by introducing a strain-mediating layer (SML) above the standard high-temperature AlN buffer layer. The strain characteristics of subsequently deposited nitride layers can be modulated by changing the growth parameters of the SML layer. This is achieved by in-situ techiniques during crystal growth without degrading the optical and structural properties of the deposited layers.

The effects of the Si doping level on the recombination dynamics and carrier (exciton) localization in modulation-doped GaN/Al0.07Ga0.93N multiple-quantum-well (MQW) structures were studied by means of photoluminescence (PL) and time-resolved PL measurements. All samples with different doping levels show a QW emission which is blue shifted with respect to the 3.48 eV PL peak from the GaN buffer layer. The decay time at the peak position remains nearly constant in the range of 320–420 ps at 2 K for all doping levels. For the undoped and low doped samples (3 × 1018 cm−3), which have less free electrons in the QWs, a non-exponential PL decay behaviour at 2 K is attributed to localized exciton recombination. The more highly doped samples (5 × 1018 cm−3 to 1020 cm−3) show almost exponential decay curves at 2 K, suggesting the recombination of free electrons and localized holes. The internal polarization-induced fields of the medium and highly-doped samples are partly screened by the electrons originating from the doping in the barriers. The emission peaks in time delayed PL spectra of these samples exhibit almost no shift as time evolves. Only the PL peak of the undoped and low-doped samples shows a redshift with time delay, related to the photogenerated carriers [1]. The decay time for the undoped sample shows non-exponential behaviour typical for localized excitons in III-N QWs. The same behaviour of decay time as a function of emission energy has been reported for InGaN QWs [2].

We have studied an enhancement of the oscillator strength for optical transitions near the Fermi energy in p-type modulation-doped quantum wells, which, so far, deserved much less attention than analogous n-type systems, because of the complicated valence band structure involved. The relatively wide (L = 150 A) quantum wells and high doping levels were used, containing more than one occupied subband. The enhancement in the photoluminescence intensity at the Fermi energy resulted from the strong correlation and multiple scattering of holes near the Fermi edge by the localized electrons.

The CdTe/CdMnTe structures studied were grown by molecular beam epitaxy on (001) GaAs substrate covered with the ZnTe/CdZnTe (10/20 nm) superlattice and then with 3.5 μm thick CdTe buffer layer. The active part of the structure consisted of 60 periods of 4 nm wide CdTe (well)/13 nm wide CdMnTe (20% Mn fraction, barrier). The first 10 periods were undoped. The following 50 periods were δ-doped with indium to the level of 4 x 10 10 cm-2 either in the middle of the QW (sample #1), or in the middle of the barrier (sample #2) or both in the middle of the QW and the barrier (sample #3).

We report results for Si layers embedded in GaAs, extending from the delta-doped (δ-doped) range up to 6 monolayers derived by means of variable temperature resistivity and Hall effect measurements, secondary ion mass spectrometry and high resolution X-ray diffractometry techniques. The conductivity transition from free carrier transport in ordered δ-layers ( 4 ML) is clearly observed. This observation is in good agreement with the secondary ion mass spectrometry and high resolution X-ray diffractometry data. Results from the intermediate case with 2-3 MLs are also discussed.

In this work we evaluate optical properties of cubic phase GaN epilayers grown on top of (001) silicon substrate prepared by a new process. Prior to the growth Si substrate was annealed at 1300-1400°C in propane. The so-prepared substrate is covered with a thin ( 4 nm) SiC wafer, which allowed a successful growth of good morphological quality cubic phase GaN epilayers. The present results confirm recent suggestion on smaller ionization energies of acceptors in cubic phase GaN epilayers.

Photoluminescence of excitons and their phonon replicas in homoepitaxial MOCVD-grown gallium nitride (GaN) layers have been studied by picosecond (ps) time-resolved photoluminescence spectroscopy. The time-resolved photoluminescence spectroscopy has shown that the free excitons and their replicas have the fastest dynamics (decay time of about 100 ps). Then, the excitons-bound-to-donors emission rises (with the rise time similar to the free excitons decay time) and decays with t = 300 ps. The excitons-bound-to-acceptors has the slowest decay (about 500 ps). It has been found that the ratio of excitons-bound-to-acceptors and excitons-bound-to-donors amplitudes and their decay times are different for 1-LO replicas and then for zero-phonon lines, whereas the ratio of amplitudes and the decay time of the 2-LO replicas are similar to the ones of the zero-phonon lines.

An influence of doping level on exciton properties in n-doped multiple quantum well structures of CdTe/CdMnTe is studied for multiple quantum well structures prepared in the way that donor (indium) concentration changes within the length of the sample. We show that the formation scenario for neutral donor bound excitons in low-dimensional structures can be different from that observed in bulk samples. We further show that in the case of such quantum well structures we can selectively excite either photoluminescence emission of localized or donor bound excitons, which is a consequence of surprisingly weak energy transfer link between two types of excitonic transitions. PACS numbers: 78.47.+pa, 78.55.Et

Optically detected magnetic resonance (ODMR) was used to study defects in 3C SiC epitaxial layers grown at high temperatures (1550°C) by chemical vapour deposition on a free-standing 3C SiC film substrate. An isotropic, very broad and asymmetric ODMR line was observed under ultraviolet light excitation. This line is shown to be due to the overlapping of two different isotropic spectra, as revealed by magnetic field modulation measurements. Both spectra can be described by an effective electron spin S = 1 2 . The higher field line with a g-value of 2.006 may be related to a silicon vacancy. Using below bandgap excitation, the lower field spectrum (g = 2.012) was found to have a triplet structure which could be due to the hyperfine of 14N. This defect is related to a new photoluminescence band in the region of 1.1–1.58 eV.

We have used micro-photo- and cathodo-luminescence at low temperatures to study the effects of sulphur doping in InP and radial InP/InAs/InP structured nanowires. Samples with pure wurtzite crystal structure, with modulated wurtzite/zincblende crystal structure and with different radial InAs growth times were investigated. We observed a doping concentration gradient along the nanowires, the location of segments of different crystal structure and thickness fluctuations on the monolayer scale of the InAs layer.

We report the fabrication of quantum wells in ZnO nanowires (NWs) by a crystal phase engineering approach. Basal plane stacking faults (BSFs) in the wurtzite structure can be considered as a minimal segment of zinc blende. Due to the existing band offsets at the wurtzite (WZ)/zinc blende (ZB) material interface, incorporation of a high density of BSFs into ZnO NWs results in type II band alignment. Thus, the BSF structure acts as a quantum well for electrons and a potential barrier for holes in the valence band. We have studied the photoluminescence properties of ZnO NWs containing high concentrations of BSFs in comparison to high-quality ZnO NWs of pure wurtzite structure. It is revealed that BSFs form quantum wells in WZ ZnO nanowires, providing an additional luminescence peak at 3.329 eV at 4 K. The luminescence mechanism is explained as an indirect exciton transition due to the recombination of electrons in the QW conduction band with holes localized near the BSF. The binding energy of electrons is found to be around 100 meV, while the excitons are localized with the binding energy of holes of ~5 meV, due to the coupling of BSFs, which form QW-like structures. Funding Agencies|Linkoping Linnaeus Initiative for Novel Functional Materials (LiLi-NFM)

Recent photoluminescence (PL) data for Mg-doped GaN at 2 K are discussed, with reference to published theoretical calculations of the electronic level structure. It is concluded that the typical PL peaks at 3.466 eV (acceptor bound exciton ABE1) and the broader 3.27 eV donor-acceptor pair (DAP) PL are the expected standard PL signatures of the substitutional Mg acceptor. Additional broader peaks at 3.455 eV (ABE2) and 3.1 eV are suggested to be related to the same acceptors perturbed by nearby basal plane stacking faults. The low temperature metastability of PL spectra is assigned to a nonradiative metastable deep level. Funding Agencies|K. A. Wallenberg Foundation||Swedish Energy Agency||Li-Li NFM Center at Linkoping University

We report comparative studies of 6-nm-thick AlxGa1-xN/AlyGa1-yN pyroelectric quantum wells (QWs) grown by plasma-assisted molecular beam epitaxy on c-sapphire substrates with a thick AlN buffer deposited under different growth conditions. The Al-rich growth conditions result in a 2D growth mode and formation of a planar QW, whereas the N-rich conditions lead to a 3D growth mode and formation of a QW corrugated on the size scale of 200-300 nm. Time-resolved photoluminescence (PL) measurements reveal a strong quantum-confined Stark effect in the planar QW, manifested by a long PL lifetime and a red shift of the PL line. In the corrugated QW, the emission line emerges 200 meV higher in energy, the low-temperature PL lifetime is 40 times shorter, and the PL intensity is stronger (similar to 4 times at 4.5K and similar to 60 times at 300 K). The improved emission properties are explained by suppression of the quantum-confined Stark effect due to the reduction of the built-in electric field within the QW planes, which are not normal to the [0001] direction, enhanced carrier localization, and improved efficiency of light extraction. Funding Agencies|RFBR|12-02-00856-a12-02-00865-a13-02-00801-a13-02-12231-ofi-m|Pesidium of RAS|24

Optical properties of a series of CdTe/CdMnTe multi quantum weJl structures grown with MBE and ALE (CdTe quantum wells only) methods are compared. Based on the results of the photoluminescence experiments we conclude that the ALE growth leads to a different lateral scale of quantum welI width fluctuations, which results in different exciton properties in two multi quantum well systems studied. In the wells grown with ALE method excitons are less localized. They can migrate in a quantum well plane between quantum well regions varying in thickness by 1 monolayer. PACS numbers: 71.35.+z, 78.47.+p , 78.55.Et

The results of photoluminescence, time-resolved photoluminescence, photoluminescence excitation and photoluminescence kinetics studies are presented for a Al0.3 Ga0.7Αs/GaΑs quantum well system grown without growth interruptions at the interfaces. The time-resolved photoluminescence measurements show drift of excitons towards lower energy states induced in a quantum well by potential fluctuations. We present also a first direct evidence for migration of free excitons from the 24 to 25 ML regions of the quantum well and interpret these results within a linear rate model, deriving the transition rate of 290 ps-1. Such inter-island migration processes have been observed till now only in growth interrupted structures. PACS numbers: 78.66.Fd, 78.47.+ρ, 73.20.Jc

Optically detected cyclotroii resonance is used for the identification of recombination transitions of two-dimensional electron gas in A1GaAs/GaAs heterostructures. Two photoluminescence emissions are attributed to the recombination of the two-dimensional electron gas. These are the so-called H-band and the Fermi level singularity photoluminescence. Optical detection of cyclotron resonance is related to the change of the band bending across the GaAs active layer and the AlGaAs barrier, which is caused by impact ionization of shallow donors in the barrier region. Influence of a long range carrier scattering on ionized impurities on a mobility of the two-dimensional carriers is studied. PACS numbers: 78.66.Fd, 73.40.Kpa, 73.20.Dx, 71.25.Jd

The results of picosecond photoluminescence kinetics of four dicherent CdTe/CdMnTe multiquantum well structures grown by MBE on GaAs sub- strates are presented. The experimental results show that excitons in CdTe quantum wells are strongly localized by potential fluctuations. Photolumi- nescence decay times of the localized excitons are considerably shorter (about 120 ps) than those reported for free or quasi-free excitons. An influence of Mn in the barriers on exciton properties is demonstrated. For narrow quan- tum wells as well as for the multiquantum well structure with the highest Mn mole fractioii the excitons migrate during their decay to the states with a lower potential energy. Longer decay times are observed for quasi-localized excitons. We show also that for strongly localized excitons the energy transfer between localized and donor bound excitons is less efficient.

Exciton properties in growth interrupted quantum wells of GaAs/AlGaAs are compared with those observed for structures grown without growth interruption during the molecular beam epitaxy process. We report observation of quasi-localized excitons in quantum well structures grown without growth interruptions. Quasi-localized excitons drift towards the states of a lower potential energy in the quantum well. For growth interrupted MBE structures islands with a constant quantum well thickness become large compared to the exciton radius. Free or lightly localized excitons are observed in that case. PACS numbers: 71.35.+-z, 73.20.Fz, 78.55.Cr

The CdZnSe/ZnSe multiquantum well (MQW) and superlattice stuctures are currently intensively studied due to their possible application in blue light emitting and semiconductor laser diodes [1]. In this communication we present the results of photoluminescence (PL) transient and optically detected cyclotron resonance (ODCR) experiments. The aim of the present study is to identify recombination transitions from the QWs and to describe their properties. We show that bound exciton spectra contribute to the low temperature PL emission from the QWs.