7 results on '"Obeng Y"'
Search Results
2. Comparative study on the effect of misalignment on bordered and borderless contacts
3. Preface: Silicon compatible emerging materials, processes, and technologies for advanced CMOS and post-CMOS applications 9
4. Graphene: Is It the Future for Semiconductors? An Overview of the Material, Devices, and Applications
5. An Overview of Recent Advances in Metrology Development for Nanoelectronics at the National Institute of Standards and Technology (NIST)
6. New Dielectric Materials
7. Metrology for 2D materials: a perspective review from the international roadmap for devices and systems.
Catalog
Books, media, physical & digital resources
Discovery Service for Jio Institute Digital Library
For full access to our library's resources, please sign in.