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2. A floating well method for exact capacitance-voltage measurement of nano technology

Author

Su, Hung-Der, Chiou, Bi-Shiou, Wu, Shien-Yang, Chang, Ming-Hsung, Lee, Kuo-Hua, Chen, Yung-Shun, Chao, Chih-Ping, See, Yee-Chaung, and Sun, Jack Yuan-Chen

Subjects
Nanotechnology -- Research, Business, Electronics, Electronics and electrical industries
Abstract

A procedure is proposed for exact capacitance-voltage measurement of nano technology.

Published
2003

3. Failure mechanism for input buffer under CDM test

Author

Kao, Tzu‐Cheng, primary, Hung, Chung‐Yu, additional, Lee, Jian‐Hsing, additional, Lien, Chen‐Hsin, additional, Chiu, Chien‐Wei, additional, Lo, Kuo‐Hsuan, additional, Su, Hung‐Der, additional, and Weng, Wu‐Te, additional

Published
2014
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