25 results on '"Wen, Shi-Jie"'
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2. Structural and physical properties of NbO2 and Nb2O5 thin films prepared by magnetron sputtering
3. Temperature Estimation of HBM2 Channels with Tail Distribution of Retention Errors in FPGA-HBM2 Platform
4. Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of DC Magnetron Sputtered VO2 Thin Films
5. Effect of modification degrees on the interfacial properties and EOR efficiency of amphiphilic Janus graphene oxide
6. Cloning and expression analysis of voltage dependent anion channel (<italic>AhVDAC</italic>) gene in the geotropism response of the peanut gynophores
7. Effect of Substrate Temperature on the Structural, Optical and Electrical Properties of DC Magnetron Sputtered VO 2 Thin Films.
8. A Bulk Built-In Voltage Sensor to Detect Physical Location of Single-Event Transients
9. Exploitations of Multiple Rows Hammering and Retention Time Interactions in DRAM Using X-Ray Radiation
10. Topology of conductive clusters in sputtered high-quality VO2 thin films on the brink of percolation threshold during insulator-to-metal and metal-to-insulator transitions
11. Synthesis, structure and optical properties of high-quality VO2 thin films grown on silicon, quartz and sapphire substrates by high temperature magnetron sputtering: Properties through the transition temperature
12. Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12, 2160
13. Self-heating-induced electrical and optical switching in high quality VO2 films controlled with current pulses.
14. The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO2 Thin Films and Their Insulator–Metal Transition Behavior
15. Structural and physical properties of NbO2 and Nb2O5 thin films prepared by magnetron sputtering.
16. Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation
17. Erratum: Assessing alpha-particle-induced SEU sensitivity of flip-chip bonded SRAM using high energy irradiation [IEICE Electronics Express Vol. 13 (2016) No. 17 pp. 20160627]
18. New insights into the impact of SEUs in FPGA CRAMs
19. The New Phenomenon of Lithium Electrochemical (De)Intercalation in Mineral Clay Materials and Their Potential Application in Rechargeable Batteries
20. The New Approach of Intercalation Material for The Application of Rechargeable Lithium Batteries
21. Experimental Study of Thermal Management Characteristics of Mass via Arrays.
22. Erratum: Zhang, C. et al., The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO 2 Thin Films and Their Insulator–Metal Transition Behavior. Materials 2019, 12 , 2160.
23. Nanodisperse transition metal electrodes (NTME) for electrochemical cells
24. Nanodisperse transition metal electrodes (NTME) for electrochemical cells
25. The Effect of Substrate Biasing during DC Magnetron Sputtering on the Quality of VO 2 Thin Films and Their Insulator-Metal Transition Behavior.
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