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23 results

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1. Research on Improving YOLOv5s Algorithm for Defect Detection in Cylindrical Coated Lithium-ion Batteries.

2. Small object detection based on attention mechanism and enhanced network.

3. An efficient lightweight convolutional neural network for industrial surface defect detection.

4. Defect Identification of Power Line Insulators Based on a MobileViT‐Yolo Deep Learning Algorithm.

5. Underwater Target Detection Utilizing Polarization Image Fusion Algorithm Based on Unsupervised Learning and Attention Mechanism.

6. Lightweight YOLOv7 Algorithm for Multi-Object Recognition on Contrabands in Terahertz Images.

7. 名词引导局部特征提取的基于文本的实例分割方法.

8. Segmentation of Unsound Wheat Kernels Based on Improved Mask RCNN.

9. Image Defogging Algorithm Based on Attention Mechanism and Split Convolution.

10. HARNU-Net: Hierarchical Attention Residual Nested U-Net for Change Detection in Remote Sensing Images.

11. Research on Algorithm for Improving Infrared Image Defect Segmentation of Power Equipment.

12. 基于级联网络的钢轨顶面缺陷检测方法研究.

13. A fish image segmentation methodology in aquaculture environment based on multi-feature fusion model.

14. Lightweight Apple Detection in Complex Orchards Using YOLOV5-PRE.

15. MFFNet: a multi-frequency feature extraction and fusion network for visual processing.

16. Multi-receptive Field Aggregation Network for single image deraining.

17. Research and Application of Fine-Grained Image Classification Based on Small Collar Dataset.

18. Dual-graph convolutional network based on band attention and sparse constraint for hyperspectral band selection.

19. SSKDN: a semisupervised knowledge distillation network for single image dehazing.

20. Using Features Specifically: An Efficient Network for Scene Segmentation Based on Dedicated Attention Mechanisms

21. An Efficient Convolutional Neural Network Model Combined with Attention Mechanism for Inverse Halftoning

22. Remote Sensing Image Denoising Based on Deep and Shallow Feature Fusion and Attention Mechanism.

23. Person reidentification based on view information and batch feature erasing.