1. 基于RT-YOLO-V5 的芯片外观缺陷检测.
- Author
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郭翠娟, 王妍, 刘净月, 席雨, 徐伟, and 王坦
- Subjects
NETWORKS on a chip ,NETWORK performance ,IMAGING systems ,SPEED ,HUMAN beings - Abstract
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- Published
- 2024
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