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A new nonlinear microscopy technique based on interference of backward-reflected third harmonic generation (I-THG) from multiple interfaces is presented. The technique is used to measure height variations or changes of a layer thickness with an accuracy of up to 5 nm. Height variations of a patterned glass surface and thickness variations of fibroblasts are visualized with the interferometric epi-THG microscope with an accuracy at least two orders of magnitude better than diffraction limit. The microscopy technique can be broadly applied for measuring distance variations between membranes or multilayer structures inside biological tissue and for surface height variation imaging. [ABSTRACT FROM AUTHOR]

Cr2Ge2Te6 is proposed as an insulating ferromagnetic substrate for the growth of tetradymite-type topological insulators, based on a refined characterization of its transport, magnetic, optical, and calculated electronic properties. It is found to be a soft ferromagnet with no visible magnetic domains over relatively large length scales and to be highly insulating with an indirect band gap and low carrier concentration. Further we present the fabrication of Bi2Te3-Cr2Ge2Te6 heterostructure samples by chemical vapor deposition and show that crystals of the two phases are oriented such that the hexagonal Te planes are aligned at their interfaces. [ABSTRACT FROM AUTHOR]