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5. Dark field Z-scan microscopic configuration for nonlinear optical measurements: Numerical study.

Author

Chis, Mihaela, Wang, Hongzhen, Cassagne, Christophe, Ciret, Charles, and Boudebs, Georges

Subjects
*NONLINEAR optics, *NUMERICAL analysis, *REFRACTIVE index, *PARAMETER estimation, *SIMULATION methods & models
Abstract

This study deals with numerical simulations to optimize the parameters of the Dark Filed Z-scan (DFZ-scan) in a microscopic configuration for third-order nonlinear (NL) refraction measurements into thin films. The method allows dynamic, transparent, nonlinear phase shifts to be clearly visible. The simulations of such images are obtained for very low-induced refractive indices. Darkfield illumination requires blocking out of the central light which ordinarily passes through and around (surrounding) the NL specimen. A table to approximate circular aperture stop size versus magnification will be given depending on the focusing lens into the tested material. [ABSTRACT FROM AUTHOR]

Published
2018
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