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One of the challenges of all synchrotron facilities is to offer the highest performance detectors for all their specific experiments, in particular for X‐ray diffraction imaging and its high throughput data collection. In that context, the DiffAbs beamline, the Detectors and the Design and Engineering groups at Synchrotron SOLEIL, in collaboration with ImXPAD and Cegitek companies, have developed an original and unique detector with a circular shape. This detector is based on the hybrid pixel photon‐counting technology and consists of the specific assembly of 20 hybrid pixel array detector (XPAD) modules. This article aims to demonstrate the main characteristics of the CirPAD (for Circular Pixel Array Detector) and its performance – i.e. excellent pixel quality, flat‐field correction, high‐count‐rate performance, etc. Additionally, the powder X‐ray diffraction pattern of an LaB6 reference sample is presented and refined. The obtained results demonstrate the high quality of the data recorded from the CirPAD, which allows the proposal of its use to all scientific communities interested in performing experiments at the DiffAbs beamline. [ABSTRACT FROM AUTHOR]

Hybrid photon counting (HPC) detectors are widely used at both synchrotron facilities and in‐house laboratories. The features of HPC detectors, such as no readout noise, high dynamic range, high frame rate, excellent point spread function, no blurring etc. along with fast data acquisition, provide a high‐performance detector with a low detection limit and high sensitivity. Several HPC detector systems have been developed around the world. A number of them are commercially available and used in academia and industry. One of the important features of an HPC detector is a fast readout speed. Most HPC detectors can easily achieve over 1000 frames s−1, one or two orders of magnitude faster than conventional CCD detectors. Nevertheless, advanced scientific challenges require ever faster detectors in order to study dynamical phenomena in matter. The XSPA‐500k detector can achieve 56 kframes s−1 continuously, without dead‐time between frames. Using 'burst mode', a special mode of the UFXC32k ASIC, the frame rate reaches 1 000 000 frames s−1. XSPA‐500k was fully evaluated at the Metrology beamline at Synchrotron SOLEIL (France) and its readout speed was confirmed by tracking the synchrotron bunch time structure. The uniformity of response, modulation transfer function, linearity, energy resolution and other performance metrics were also verified either with fluorescence X‐rays illuminating the full area of the detector or with the direct beam. [ABSTRACT FROM AUTHOR]

A new photon‐counting camera based on hybrid pixel technology has been developed at the SOLEIL synchrotron, making it possible to implement pump–probe–probe hard X‐ray diffraction experiments for the first time. This application relies on two specific advantages of the UFXC32k readout chip, namely its high frame rate (50 kHz) and its high linear count rate (2.6 × 106 photons s−1 pixel−1). The project involved the conception and realization of the chips and detector carrier board, the data acquisition system, the server with its specific software, as well as the mechanical and cooling systems. This article reports on in‐laboratory validation tests of the new detector, as well as on tests performed at the CRISTAL beamline within the targeted experimental conditions. A benchmark experiment was successfully performed, showing the advantages of the pump–probe–probe scheme in correcting for drifts of the experimental conditions. [ABSTRACT FROM AUTHOR]

This paper presents the performance of a single‐photon‐counting hybrid pixel X‐ray detector with synchrotron radiation. The camera was evaluated with respect to time‐resolved experiments, namely pump–probe–probe experiments held at SOLEIL. The UFXC camera shows very good energy resolution of around 1.5 keV and allows the minimum threshold setting to be as low as 3 keV keeping the high‐count‐rate capabilities. Measurements of a synchrotron characteristic filling mode prove the proper separation of an isolated bunch of photons and the usability of the detector in time‐resolved experiments. [ABSTRACT FROM AUTHOR]

This paper describes a method for rapid measurements of the specular X-ray reflectivity signal using an area detector and a monochromatic, well collimated X-ray beam (divergence below 0.01°), combined with a continuous data acquisition mode during the angular movements of the sample and detector. In addition to the total integrated (and background-corrected) reflectivity signal, this approach yields a three-dimensional mapping of the reciprocal space in the vicinity of its origin. Grazing-incidence small-angle scattering signals are recorded simultaneously. Measurements up to high momentum transfer values (close to 0.1 nm-1, also depending on the X-ray beam energy) can be performed in total time ranges as short as 10 s. The measurement time can be reduced by up to 100 times as compared with the classical method using monochromatic X-ray beams, a point detector and rocking scans (integrated reflectivity signal). [ABSTRACT FROM AUTHOR]

A new experimental approach to perform in situ electric field diffraction on single crystals using an on-then-off pump-probe mode in situ ( i.e. the field-switching method) with a synchrotron or a laboratory X-ray source is presented. Taking advantage of the fast readout of the XPAD hybrid pixel two-dimensional detector and its programmable functionalities, the operation mode of the detector has been customized to significantly increase the efficiency of the method. The very weak electric field-induced structural response of a piezoelectric crystal can be accurately measured. This allows the piezoelectric tensor to be precisely obtained from Δθ shifts while the structural variations can be modelled using a full set of Δ I/ I data. The experimental method and methodology are detailed and tested as a case study on pure piezoelectric compounds belonging to the α-quartz family (SiO2 and GaAsO4 single crystals). Using the two scan modes developed, it is demonstrated that tiny Bragg angle shifts can be measured as well as small field-induced Bragg intensity variations (<1%). The relevance of measurements performed with an X-ray laboratory source is demonstrated: partial data sets collected at synchrotrons can be completed, but more interestingly, a large part of the study can now be realized in the laboratory (medium to strong intensity reflections) in a comparable data collection time. [ABSTRACT FROM AUTHOR]