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This work investigates the endurance and performance of aluminum-doped zinc oxide (AZO) thin films fabricated on flexible polyethylene terephthalate (PET) substrates, providing new insights into their degradation linked to mechanical flexing and accelerated thermal cycling (ATC). The current study uniquely combines cyclic bending fatigue at 23 °C and 70 °C with ATC between 0 °C and 100 °C, simulating operational stresses in real-world environments, in contrast to previous research that has focused primarily on either isolated mechanical or thermal effects. The 425 nm thick films showed high transparency and conductivity, making them suitable materials for flexible electronics and optoelectronic devices. In this work, electrical resistivity, one of the most important performance parameters, was investigated after each mechanical or thermal cycle. The results indicate that mechanical cycling at high temperatures can drastically enhance the crack formation and electrical degradation, with an over 250% change in the electrical resistance (PCER) after 12,000 cycles at 70 °C and more than 300% after 500 thermal cycles. The highly deleterious effects of combined stressors on the structural integrity and electrical properties of AZO films are underlined by these observations. This study further suggests that the design of more robust AZO-based materials/coatings would contribute toward achieving better durability in flexible electronic applications. These findings also go hand in glove with the ninth goal of the United Nations' Sustainable Development Goals, specifically Target 9.5: Enhance Research and Upgrade Industrial Technologies. [ABSTRACT FROM AUTHOR]

This study examines copper thin films under tensile stress and their shape and percentage change in electrical resistance (PCER) as a function of applied strain. Copper films of 100 and 200 nm thickness were sputtered onto polyethylene terephthalate (PET) substrates and were then sequentially stretched to examine how film thickness affects strain-induced morphological changes and electrical resistance. A scanning electron microscope (SEM) was used to track crack patterns, and electrical resistance was monitored throughout tensile testing. Thinner films (100 nm) had quick crack initiation and propagation, leading to an increase in PCER under strain, while thicker films (200 nm) had more gradual morphological and electrical resistance changes. This differential reaction demonstrates the importance of film thickness in mechanical deformation and strain sensitivity, which could affect the design of flexible electronic devices that require mechanical durability and reliable electrical performance. These findings will help to optimize film thickness for stretchable sensors and wearable electronics to balance strain sensitivity and morphological degradation. This study will help designers and users of sensors, stretchable electronics, and other devices that require mechanical durability and electrical performance to understand the relationship between mechanical deformation and electrical properties in thin films. This paper aligns with the ninth goal of the United Nations Sustainable Development Goals, specifically Target 9.5: Enhance Research and Upgrade Industrial Technologies. [ABSTRACT FROM AUTHOR]

The mechanical and electrical deterioration of chromium (Cr) thin films sputtered onto polyethylene terephthalate (PET) substrates under tensile strain was studied. Understanding mechanical and electrical stability due to imposed strain is particularly important for device reliability, as the demand for flexible electronic devices increases. Cr thin films, widely spread across the field of electronic and sensor applications, face crack propagation with electrical degradation with tensile stress that can seriously compromise the performance. Accordingly, this study offers new findings on how Cr film thickness might influence crack formation and electrical resistance differently and also the general guidelines for flexible electronic component design with respect to long-term durability. Electrical resistances were measured while mechanically stretching 100- and 200 nm thin sheets. The study focused on crack development and propagation mechanisms in both film thicknesses and their effects on percentage change in electrical resistance (PCER). Scanning electronic microscopy (SEM) was used to characterize surface morphology and observe cracks as the strain rose. Early crack formation in 100 nm Cr films led to rapid PCER increases due to quick crack propagation and fast electrical degradation. Thicker 200 nm films, however, showed a more gradual PCER rise with fewer but deeper cracks, indicating a regulated strain response. Unlike the sharp PCER spike in 100 nm films, 200 nm samples were more variable, with three out of four showing a slight PCER decrease at the end, hinting at partial crack repair or conductive realignment before full failure. These results underscore the role of layer thickness in managing crack propagation and electrical stability, relevant for flexible electronics and strain sensors. This paper is aligned with the ninth goal of the United Nations Sustainable Development Goals, specifically Target 9.5: Enhance Research and Upgrade Industrial Technologies. [ABSTRACT FROM AUTHOR]

The paper presents a methodology that integrates Quality-Function Deployment (QFD) and the Theory of Inventive Problem Solving (TRIZ) used for generating innovative solutions to design problems. It proposes a modified analytical House of Quality (HoQ) to reveal and prioritize contradictions between design parameters and between customer requirements. The proposed methodology extends the traditional HoQ and eliminates the need for the TRIZ's Function Analysis (FA) procedure. Function Analysis involves identifying the functions of a product or process elements and trying to find contradictions between the system elements. The usability of the proposed method is illustrated through the redesign of an assembly workshop to overcome major problems addressed by the various stakeholders of the process. The new design of the assembly workshop helps reduce the number of work stages from 3 to 1, reduce the number of workers from 4 to 2, decrease rework, decrease the percentage of damaged products, enhance workplace ergonomics and improve the overall system efficiency. [ABSTRACT FROM AUTHOR]

During operation, electronic components are exposed to high temperatures that may last for long periods, depending on the operating duration. Solder joints are one of the components most affected by thermal aging while in service. In this research, the effect of thermal aging duration and temperature on the mechanical properties of 92.8%Sn-3%Ag-0.5%Cu-3.3%Bi (Cyclomax) was investigated. The novelty of this work lies in the study of the important properties of a new generation of Sn-Ag-Cu (SAC) materials (i.e., Cyclomax). Cyclomax is rare in industry and immature in research. To understand the effect of thermal aging, the microstructure was investigated, and changes in it and its mechanical properties were observed. To simulate solder joints in electronic devices, samples of solder balls were prepared and attached to copper pads on electronic boards. Most samples were then treated at 150 °C or 100 °C for up to 1000 h and some samples were left untreated for comparison. A scanning electron microscope (SEM) was used to obtain images of the microstructure. The shear stress–shear strain relationships, including the ultimate shear strength (USS), the modulus of elasticity and the ultimate energy (UE), were investigated. The microstructure images indicated the presence of a layer of Cu6Sn5 on top of the copper pad before thermal aging was applied. The thickness of this layer increased with the application of thermal aging over time. The results for the shear stress–shear strain relationship indicate that all of the USS, the total energy (TE) to shear off the solder balls and the UE decreased at the beginning of the thermal aging and then reversed to increase later. In general, isothermal aging reduces the performance of Cyclomax solder joints in terms of the minimum force and energy required to separate and subsequently damage electronic components. [ABSTRACT FROM AUTHOR]

Solder joints are subjected to varied stress cycle circumstances in the electronic packaging service life but are also influenced by aging. There has been limited investigation into the influence of aging and varying cycles on SnAgCu-Bi (SAC-Bi) solder joint fatigue. Cyclic fatigue tests were performed on solder joints of several alloys, including SnAgCu (SAC305), SnAgCu-Bi (SAC-Q), and SnCu-Bi (SAC-R). Individual solder joints were cycled under varying stress levels, alternating between mild and harsh stress levels. At least seven samples were prepared for each alloy by alternating between 25 mild stress (MS) cycles and three harsh stress (HS) cycles until the solder joint broke off. The impact of aging on Bi-doped solder joints fatigue under varied amplitude stress was examined and predicted for 10 and 1000 h under 125 °C. Because of the "Step-up" phenomenon of inelastic work, a new fatigue model was developed based on the common damage accumulation (CDA) model. The experimental results revealed that aging reduced the fatigue life of the tested solder alloys, particularly that of SAC305. According to the CDA model, all solder alloys failed earlier than expected after aging. The proposed model uses the amplification factor to assess inelastic work amplification after switching between the MS and HS cycles under varying stress amplitude conditions. The amplification factor for the SAC-Bi solder alloys increased linearly with fracture initiation and substantially followed crack propagation until the final failure. Compared with existing damage accumulation models, the proposed fatigue model provides a more accurate estimation of damage accumulation. For each case, the cut-off positions were examined. The SAC-Q amplification factor increased linearly to 83% of its overall life, which was much higher than that of SAC305 and SAC-R. This study identified three distinct failure modes: ductile, brittle, and near intermetallic compound (IMC) failure. It was also observed that SAC-Q with an organic solderability preservatives (OSP) surface finish was more susceptible to brittle failure owing to the excessive brittleness of the alloy material. [ABSTRACT FROM AUTHOR]

The surface finish (SF) becomes a part of the solder joint during assembly and improves the component's reliability. Furthermore, the SF influences the solder joint's reliability by affecting the thickness of the intermetallic compound (IMC) layer at the solder interface and copper pads. In this experiment, five different alloys are used and compared with the SAC305 alloy, two of which, Innolot and SAC-Bi, are bi-based solder alloys. This study includes three common SFs: electroless nickel immersion gold (ENIG), immersion silver (ImAg), and organic solderability preserve (OSP). The performance of three surface finishes is examined in terms of component characteristic life. All of the boards were isothermally aged for twelve months at 125 °C. The boards were then exposed to 5000 cycles of thermal cycling at temperatures ranging from −40–+125 °C. Most of the current research considers only one or two factors affecting the reliability of the electronic package. This study combines the effect of multiple factors, including solder paste content, SF, isothermal aging, and thermal cycling, to ensure that the test conditions represent real-world applications. In addition, the electronics packages are assembled using commercialized alloys. The current study focuses on a high-performance alloy already present in the electronic market. The failure data were analyzed statistically using the Weibull distribution and design of experiments (DOE) analysis of variance (ANOVA) techniques. The findings reveal that the micro and uniformly distributed precipitates in solder microstructures are critical for high-reliability solder joints. Re-crystallization of the thermally cycled solder joints promotes the local formation of numerous new grains in stress-concentrated zones. As the fracture spreads along these grain boundaries and eventually fails, these new grains participate in crack propagation. Aging significantly worsens this situation. Finally, although the ENIG surface finish with its Ni layer outperforms other SFs, this does not imply that ENIG is more reliable in all solder paste/sphere/finish combinations. [ABSTRACT FROM AUTHOR]

The failure of one solder joint out of the hundreds of joints in a system compromises the reliability of the electronics assembly. Thermal cycling is a result of both creep–fatigue mechanisms working together. To better understand the failure process in thermal cycling, it is crucial to analyze both the effects of creep and fatigue mechanisms in a methodical manner. In this work, individual solder junctions are subjected to accelerated shear fatigue testing to investigate the effects of creep and fatigue on joint dependability at room temperature. A modified fixture is used to conduct fatigue tests on an Instron 5948 micromechanical tester. SAC305 joints with an OSP surface finish were cycled under stress control at first, and then the strain was maintained for a set amount of time. In this investigation, three stress amplitudes of 16, 20, and 24 MPa are used, together with varying residence periods of 0, 10, 60, and 180 s. The fatigue life of solder junctions is described for each testing condition using the two-parameter Weibull distribution. Additionally, as a function of stress amplitude and residence time, a dependability model is created. For each testing scenario, the progression of the stress–strain loops was studied. By quantifying relevant damage metrics, such as plastic work per cycle and plastic strain at various testing circumstances, the damage due to fatigue is distinguished from creep. To investigate the relationships between plastic work and plastic strain with fatigue life, the Coffin–Manson and Morrow Energy model is used. The results indicate that using greater stress magnitudes or longer dwell periods significantly shortens fatigue life and dramatically increases plastic work and plastic strain. The housing impact is significant; in some circumstances, testing with a longer dwelling period and lower stress amplitude resulted in more damage than testing with a shorter dwelling period and higher stress levels. When illustrating the fatigue behavior of solder junctions under various stress amplitudes or dwellings, the Coffin–Manson and Morrow Energy model were both useful. In the end, general reliability models are developed as functions of plastic work and plastic strain. [ABSTRACT FROM AUTHOR]

The mechanical and fatigue properties of microelectronic interconnection materials are important issues in critical applications in the life of electronic assemblies. Due to the growth in the applications of electronic components in new technological products used in tough conditions, evaluating the reliability of solder alloys has become crucial to the prediction of product life. SAC (Sn-Ag-Cu) solder alloys are common lead-free alloys used to form solder joints. In the current study, the reliability of individual SAC305 solder joints in actual setting conditions with an organic solderability preservative (OSP) surface finish was examined using an accelerated shear fatigue test at different load levels (16 MPa, 20 MPa, and 24 MPa). Four operating temperature levels (−10, 25, 60, and 100 °C) were also used. Seven samples were utilized at each experimental condition. An orthogonal array (L12) was employed for this experiment. The fatigue behavior of the SAC305 solder joints in actual setting conditions was described by a two-parameter Weibull distribution. The characteristic life and the shape parameter were extrapolated from the Weibull distribution for each experimental condition. Characteristic life was employed to represent the fatigue resistance of the solder joints. For each sample, the inelastic work per cycle and plastic deformation were determined. The results indicated a notable increase in the inelastic work per cycle and the plastic strain as a result of increasing either the stress load or the working temperature. Combinations of stress amplitude, working temperature, inelastic work, and plastic deformation were applied as inputs to the fuzzy system for computing a comprehensive output measure (COM-Value) using the Mamdani method. A negative relationship was observed between the solder life and the four fuzzy inputs. To fuzzify the inputs of the fuzzy system, two membership functions, "MFs", were formed for each input, and five MFs were set for the output. The center-of-gravity (COG) theorem was utilized as a defuzzification method in the fuzzy inference system. The characteristic life of the solder joints was predicted by the COM-Value, which was used as an independent variable. Finally, The COM-Value was used to generate a general predicted reliability model for SAC305 solder joints with an acceptable model adequacy index. [ABSTRACT FROM AUTHOR]

The interconnection materials that are used in electronics assembly fabrication operating in harsh environmental conditions are frequently exposed to different types of mechanical stress and fatigue. Fatigue resistance does significantly affect the reliability of electronic assemblies. SAC alloys are commonly utilized in electronic assemblies’ fabrication operating in harsh conditions due to their superior mechanical and fatigue properties. Hence, this provokes the need to model and perform a detailed statistical analysis of their reliability behavior. SAC305 is commonly used as a lead-free alloy which is being utilized as a replacement of the eutectic SnPb alloy. The main goal of this study is to investigate the effect of aging temperature on the fatigue and mechanical behavior of SAC305 solder joints using accelerated shear-fatigue and shear tests. An Instron Microtester machine with a customized fixture was used to perform the tests. A two-factor test matrix for the fatigue test was constructed; where the stress amplitude has three levels (16, 20, and 24MPa) and the aging temperature has four levels (0, 50, 100, and $150^{\circ }\text{C}$). Microstructural analysis was performed on samples aged at different temperatures using SEM microscopy to address the evolutions in the precipitates size and the intermetallic compound (IMC) layer. A stress-life equation and an Arrhenius model are used to develop a general reliability model as a function of aging temperature and stress amplitude. The relationship between the fatigue life and the inelastic work were analyzed using Morrow Energy equation. The results indicate a major reduction in the reliability and shear strength of the solder joints with increasing the aging temperature. Aging has been also found to have a more notable effect on the fatigue life when compared to shear strength. [ABSTRACT FROM AUTHOR]

Many electronic products are subjected to heat for long periods, depending on their operations. Thus, it is expected that the physical and mechanical properties of electronic elements, including the soldering joints, will be affected. In this study, the impact of thermal aging time and temperature on the microstructure and mechanical properties of 96.5Sn–3.0Ag–0.5Cu (SAC305) was investigated. The samples used were SAC305 solder balls attached to copper pads. The research began by examining the microstructure of the aged samples at 150 °C for 100 and 1000 h. Then, this was compared to the microstructure of the same samples without thermal aging. Then, five groups of 10 samples were prepared from a shear stress–shear stain experiment. The first group was as produced, the second group was aged for 2 h, the third group was aged for 10 h, the fourth group was aged for 100 h, and the fifth group was aged for 1000 h. All groups were aged at a temperature of 150 °C. An Instron testing machine was used to plot a shear stress–shear stain curve until the ball was completely sheared off the pad. The mechanical properties, including the ultimate shear strength, the ultimate energy used to shear the ball, and the total energy used to shear the ball at all thermal aging times were then estimated. The results of this study indicated the formation of a layer of Cu6Sn5 over the copper pad, which thickened with thermal aging time. Furthermore, the ultimate and total shear strengths decreased with thermal aging time. The same procedure was repeated to assess the ultimate shear strength at 100 °C. The decrease in ultimate shear strength was more severe with increasing thermal aging temperature. [ABSTRACT FROM AUTHOR]

In this paper, a Markovian model is constructed to test a flexible manufacturing cell's (FMC) performance. The considered FMC includes a conveyer belt, robot, and n machines. The conveyer belt delivers the working part to the robot, and the robot picks it up and loads it onto the machines. The movement of a working part from one step to the next depends on the availability of the tool in the next step (i.e., conveyer belt, robot, and machine). Any machine is assumed to potentially fail during the processing time as a result of high loading stresses. First, a Markovian model is constructed for single-machine and double-machine FMCs. Then, a generalized FMC with an n-machine is constructed. The introduced model is illustrated with two numerical examples for both the single- and triple-machine. The Markov chain model can be used to estimate the FMC performance measures (i.e., overall utilization of machines and production rate). It is used to analyze the response of these measures under varying parameters (i.e., conveyor belt delivery rate, robot loading rate, processing rate of a machine, failure rate of a machine, and down machines' repairing rate). Moreover, an economic model based on the Markov chain model is introduced to analyze the FMC's net profit under these varying parameters. [ABSTRACT FROM AUTHOR]

The distribution of a normally distributed hardware is changed to a lower truncated normal distribution after it has been in service for a certain period. Therefore, it is necessary to approximate this type of distribution with simple, applicable and accurate models. In the current paper, a model is proposed to represent the lower truncated normal distribution very accurately. To evaluate the model’s accuracy, the truncation is used up to 50% of the original domain from left. The results show an increase in the model maximum deviation from true lower truncated normal distribution with the truncation percentage. At 50% truncation, the maximum deviation is 0.0000212. Besides being very accurate, the model is viable and simple, and it can be used manually, or with the help of a spreadsheet. [ABSTRACT FROM AUTHOR]

The reliability of electronic assemblies is a vital criterion used to assure product quality over its lifetime. Weibull distribution is the most common distribution utilized to describe the reliability data. Most of the studies use the Weibull scale parameter, or characteristic life, to compare alternatives and make a selective decision. This may not lead to achieving the optimal parameters which can be problematic because this method doesn't consider the variability behavior of the fatigue life. In this study, a new approach for process parameters selection is proposed to find the optimal parameter values that improve the micro-optimality selection process based on reliability data. In this study, a new approach is proposed based on examining the solder joint reliability by using a multi criteria analysis. The fuzzy logic is utilized as a tool to solve the multi criteria problem that is presented from the proposed approach. The reliability of microelectronic connections in thermal cycling operating conditions is used as a validation case study. In the validation case study, the optimal process parameters are found for ball grid array electronic components. Two levels of the solder sphere materials, three levels of the surface finish, and 10 levels of solder paste alloys are studied as process parameters. Using the proposed approach, four quality responses are employed to assess the reliability data, including the scale parameter, the B10 (life at 10% of the population failure), mean-standard deviation response, and the signal to noise ratio (SNR). The fuzzy logic is applied to solve the multiresponse problem. An optimal process parameter setting that considers different quality characteristics was found for the validation case study. ENIG surface finish, SAC305 solder sphere, and material six were the optimal factor levels that are obtained for the aged CABGA208 component using the proposed approach. [ABSTRACT FROM AUTHOR]

SAC-based alloys are one of the most common solder materials that are utilized to provide mechanical support and electrical connection between electronic components and the printed circuit board. Enhancing the mechanical properties of solder joints can improve the life of the components. One of the mechanical properties that define the solder joint structure integrity is the shear strength. The main objective of this study is to assess the shear strength behavior of SAC305 solder joints under different aging conditions. Instron 5948 Micromechanical Tester with a customized fixture is used to perform accelerated shear tests on individual solder joints. The shear strength of SAC305 solder joints with organic solderability preservative (OSP) surface finish is investigated at constant strain rate under different aging times (2, 10, 100, and 1,000 h) and different aging temperatures (50, 100, and 150°C). The nonaged solder joints are examined as well for comparison purposes. Analysis of variance (ANOVA) is accomplished to identify the contribution of each parameter on the shear strength. A general empirical model is developed to estimate the shear strength as a function of aging conditions using the Arrhenius term. Microstructure analysis is performed at different aging conditions using scanning electron microscope (SEM). The results revealed a significant reduction in the shear strength whenthe aging level is increased. An increase in the precipitates coarsening and intermetallic compound (IMC) layer thickness are observed with increased aging time and temperature. [ABSTRACT FROM AUTHOR]

Background: Studies suggest that nursing staff during pandemics such as H1N1 Influenza and COVID-19 exhibit higher than usual stress levels due to an increasingly overburdened healthcare system and increasing infection rates. This study aims to investigate the major stressors and coping strategies reported by nurses working directly with potentially infectious patients in Alabama, United States, during the COVID-19 pandemic. Materials and Methods: A cross-sectional questionnaire study was conducted with nursing staff working in hospital settings in the state. The questionnaire was completed by 109 nurses working in hospitals that treated COVID-19 patients. Results: Around 71% of the nursing staff were concerned about receiving more COVID-19 patients and exhibited heightened workload-related stress resulting from taking care of infected patients. The study found that most nurses (82%) are stressed about getting their friends and family infected. Overall, younger, less experienced nurses reported more stress levels compared to older, senior-level nurses. Findings suggest that many nurses fail to perceive protective measures as an effective coping strategy, with only 75% reporting problem-solving strategies such as hand washing and wearing a face mask, and only 60% avoiding public transportation and crowded spaces. Findings also suggest a lack of organizational support including psychiatric assistance, with no nurses reportedly seeking psychological therapy. Conclusion: The COVID-19 pandemic increased the stress level of the nursing staff in Alabama. The study finds that the cases in the state of AL are still increasing dramatically, which can overwhelme the healthcare system and escalate nurse stress levels. [ABSTRACT FROM AUTHOR]

The reliability of electronic assemblies is exceedingly reliant on the life of solder joints. Many factors may influence the fatigue life and mechanical properties of solder joints. Aging is one of the main factors that adversely affect the reliability of solder joints. In this article, the mechanical reliability of individual SnAgCu solder joints is studied at different aging conditions. The experiments include aging then cycling solder joints in stress-controlled shear fatigue at different stress amplitudes (16, 20, and 24 MPa) until complete failure. The aging conditions include three levels of aging temperatures (50 °C, 100 °C, and 150 °C) and four levels of aging time (2, 10, 100, and 1000 h). The effect of stress amplitude, aging time, and aging temperature on the fatigue life is investigated. The evolutions in the hysteresis loop, including the inelastic work dissipation, are explored by studying the stress–strain diagrams. The results showed that the fatigue life was affected by the stress amplitude, where increasing the stress by a factor of 2 leads to life reduction by a factor of 22. It was also found that increasing the aging time leads to nonlinear life reduction, where the first few hours of aging had the largest effect. Increasing the aging temperatures aggregates the aging time effect and leads to less fatigue resistance. Overall, increasing the aging time, temperature, and/or stress amplitudes leads to an increase in the work dissipation per cycle, which creates more damage and leads to less number of cycles to failure. The effect of these factors was fit into mathematical equations. Then, a general reliability model as a function of those parameters was developed. [ABSTRACT FROM AUTHOR]

Reliability of microelectronic assemblies is typically limited by the fatigue failure of one of the interconnected solder joints. The fatigue behavior of the lead-free solder joints doped with bismuth under different stress loading and aging conditions is not yet understood. This article investigates the effect of adding bismuth on the mechanical reliability of SAC alloys considering different loading and aging conditions. The fatigue behavior and shear strength of individual SAC305 (Sn–3.0Ag–0.5Cu) and SAC-Q (Sn–3.4Ag–0.5Cu–3.3Bi) solder joints are examined and compared. A unique experiment is designed to test the individual solder joints using a micromechanical testing system. The results show that the fatigue life and shear strength of SAC-Q with Bi are much higher than SAC305 regardless of the aging and stress conditions. It was also found that increasing stress amplitude leads to a decrease in the fatigue life for both alloys. The aging time has a negative effect on the fatigue life and shear strength of both alloys. The impact of aging on SAC-Q solder joints is significantly less than that for SAC305. Microstructure analysis shows a substantial amount of precipitates coarsening with aging for SAC305 compared with SAC-Q. Hysteresis loop analysis shows that increasing the cycling stress amplitude and aging time leads to an increase in the work per cycle and plastic strain. Common fatigue models, such as Morrow energy model and Coffin–Manson model, fail to predict the life considering the effect of aging; aging affects the constants of both models. [ABSTRACT FROM AUTHOR]

Solder joints in electronic assemblies are subjected to mechanical cycling in normal operating conditions. Testing individual solder joint in mechanical cycling allows monitoring the evolution of hysteresis loop with time and provides the ability to study the factors that affect the reliability. In this article, the effect of surface finish on the fatigue behaviors of four doped lead-free solder alloys (CycloMax, Innolot, Ecolloy, and SAC-X-Plus) and SAC305 was investigated. Individual solder joints with three surface finishes [organic solderability preservative (OSP), immersion silver (ImAg), and electroless nickel immersion gold (ENIG)] were prepared and subjected to various cyclic shear stress loadings until complete failure. Hysteresis loop was systematically recorded using an Instron machine. Characteristic fatigue life and energy dissipation per cycle were analyzed, and the Morrow energy model was applied to empirically predict the fatigue life as a function of work dissipation. Failure mechanisms were investigated as well using SEM/EDS, and the results were correlated with the fatigue behavior of the solder joints. The results indicated that the fatigue resistance of the solder alloys decreased with the increase in stress amplitude. The fatigue resistance of the solder joints with OSP and ImAg surface finishes outperformed ENIG surface finish. CycloMax with OSP surface finish was associated with the best fatigue resistance, while SAC-X-Plus with ENIG surface finish was associated with the worst fatigue resistance. Three failure modes were detected in this study: ductile, brittle, and near-intermetallic compound (IMC) failure. It was also found that Innolot with ENIG surface finish is more susceptible to brittle failure because of the excessive brittleness associated with this alloy. [ABSTRACT FROM AUTHOR]

The updated legend for Figure 3 now reads: "The Weibull probability plots for SAC305 solder joints cycled at room temperature and at different load levels (reused and modified from [30])." Now reads: "Figure 3 shows the probability plot of the Weibull distribution for SAC305 solder joints that were cycled at different stress amplitudes at room temperature (25°C) [30]. [Extracted from the article]

The reliability of an electronic assembly is typically limited by the failure of one of the solder interconnections. One of the key factors that define the quality of solder interconnections is the strength of the solder joint attachment to the printed circuit board (PCB). The ball shear testing is commonly used as a quantitative approach to evaluate the integrity of the solder. Several factors control the shear strength and failure mechanism of solder joints, including the surface finish, solder alloy composition, and speed of shearing (shear strain rate). In this paper, the effect of surface finish on the shear properties of various “microalloyed” SnAgCu-based solder materials was investigated. Individual solder joints were fabricated on a PCB with a solder mask defined configuration. A series of shear testing was conducted at four different strain rates of 0.001, 0.01, 0.1, and 1 s−1. Shear stress–strain curves were recorded for each test, and both shear strength and shear energy were measured. Following the shear testing, fractured top surfaces and cross sections were inspected using SEM/EDS microscopy to characterize the failure mechanism. The results showed that both shear strength and shear energy increase with increasing shear strain rate due to the viscoplasticity of the solder materials. Failure mode analysis indicated the existence of three failure mechanisms, including ductile failure, brittle failure, and mixed failure. Higher occurrence of brittle failure was observed when the shear strain rate is high regardless of surface finish. It was also found that the combination of solder alloy with high silver (Ag) and bismuth (Bi) content and electroless Ni/immersion Au (ENIG) surface finish is more susceptible to brittle failure compared to the rest of solder alloy-surface finish combinations. [ABSTRACT FROM AUTHOR]

The behavior of lead-free solder alloys under realistic service conditions is still not well understood. Life prediction of solder joints relies on conducting accelerated tests and extrapolating results to service conditions. This can be very misleading without proper constitutive relations and without understanding the effects of cycling parameter variations common under realistic service conditions. It has been shown that the fatigue life depends on the inelastic work accumulation, independently of cycling-induced material property variations, which explains the breakdown of damage accumulation rules and allows the development of a modified Miner's rule. This paper discusses the interacting effects of strain rate and amplitude variations on solder joint fatigue life. Individual SnAgCu solder joints with two different Ag contents (SAC305 and SACI05) were tested in low cycling shear fatigue under single and varying amplitudes with different strain rates. Such a shear fatigue experiment allows the measurement of work accumulation and the evolution of solder deformation properties during cycling. The results showed that cycling with a lower strain rate at fixed amplitude causes more damage per cycle. Alternating between mild amplitude at a high strain rate and harsh amplitude at a low strain rate leads to ongoing increases in the rate of damage at the mild amplitude and thus relatively rapid failure. In comparing SAC305 with SAC105, the effect of strain rate on both alloys is almost the same, and SAC305 is still more fatigue resistant than SAC 105 in varying amplitude cycling with any strain rate. [ABSTRACT FROM AUTHOR]

Common damage accumulation rules fail to predict the fatigue life of solder joints under realistic service conditions where cycling amplitudes vary over time. A modification of Miner’s rule of linear damage accumulation has been proposed that accounts for effects of amplitude variations in, for example, the vibration of microelectronic assemblies with lead-free solder joints on the average or characteristic fatigue life. We are, however, obviously much more concerned with the first failure across a very large sample set. Prediction of, say, the first failure out of 10000 or a million would require the extrapolation of experimental failure distributions and the assumption of a shape of this distribution. Even qualitative comparisons of accelerated test results and their scatter should account for effects of amplitude variations. We have argued that the long-term life of solder joints in vibration or cyclic bending is limited by the accumulation of inelastic work, and that much can be learned from the low cycle fatigue behavior in shear. Individual ball grid array scale SAC305 and SAC105 solder joints were cycled in shear at room temperature with combinations of two different stress amplitudes. Relying on our modified Miner’s rule and the associated understanding of the effects of amplitude variations, we show that the statistical uncertainty in the fatigue life of solder joints under a specific set of realistic service conditions must be significantly greater than measured in fixed amplitude cycling tests. The predicted failure distribution was best fit by a Weibull distribution over a limited range, but we argue that the assumption of such a distribution is likely to be increasingly conservative when it comes to the prediction of earlier failure. Estimates are provided for the potential errors. [ABSTRACT FROM PUBLISHER]

The fatigue behavior of solder joints in realistic service applications is still not well understood. Service life prediction based on conducting accelerated tests and extrapolating test results therefore involves a high potential for error. Understanding both the evolution of solder joint properties and the damage accumulation has proved to be critical to reliability modeling. Damage accumulation in isothermal cycling is shown to scale with the accumulated inelastic work even in complex cycling scenarios, so that the life of a solder joint ends upon accumulation of a given amount of work. Individual ball grid array solder joints were cycled in shear fatigue experiments with different load amplitudes and strain rates. The effects of load amplitudes and strain rates on the work accumulation and fatigue life were systematically addressed. The correlation between different loading scenarios and the accumulated work to failure was also discussed. The results showed that the accumulated work until the development of a major crack is constant regardless of the load amplitude. After that the accumulated work to failure is lower for larger load amplitudes. For some reason, a larger fraction of the work appears to be dissipating as heat at lower load amplitude, but only during crack growth. On the other hand, the strain rate affects the fraction of the work going to heat even before the development of a major crack. [ABSTRACT FROM PUBLISHER]

The extrapolation and generalization of accelerated test results for lead free solder joints require the identification of a damage function that can be counted on to apply beyond the region of the test. Individual ball grid array (BGA) scale Sn3Ag0.5Cu (SAC305) solder joints were subjected to isothermal shear fatigue testing at room temperature and 65 °C. The resulting mechanical response degradation and crack behavior. including strain hardening, crack initiation, and propagation, were correlated with the inelastic work and effective stiffness derived from load--displacement hysteresis loops. Crack initiation was found to scale with the accumulated work, independently of cycling amplitude and strain rate. The subsequent damage rate varied slightly with amplitude. [ABSTRACT FROM AUTHOR]

Solder joints in electronic assemblies are subjected to mechanical and thermal cycling. These cyclic loadings lead to the fatigue failure of solder joints involving damage accumulation, crack initiation, crack propagation, and failure. Aging leads to significant changes on the microstructure and mechanical behavior of solder joints. While the effect of thermal aging on solder behavior has been examined, no prior studies have focused on the effect of long-term room temperature aging (25 °C) on the solder failure and fatigue behavior. In this paper, the effects of long-term room temperature aging on the fatigue behavior of five common lead-free solder alloys, i.e., SAC305, SAC105, SAC-Ni, SAC-X-Plus, and Innolot, have been investigated. Several individual lead-free solder joints on printed circuited boards with two aging conditions (no aging and 4 years of aging) have been prepared and subjected to shear cyclic stress-strain loadings until the complete failure. Fatigue life was recorded for each solder alloy. From the stress-strain hysteresis loop, inelastic work and plastic strain ranges were measured and empirically modeled with the fatigue life. The results indicated that 4 years of room temperature aging significantly decreases the fatigue life of the solder joints. Also, inelastic work per cycle and plastic strain range are increased after 4 years of room temperature aging. The fatigue life degradation for the solder alloys with doped elements (Ni, Bi, Sb) was relatively less compared to the traditional SAC105 and SAC305. [ABSTRACT FROM AUTHOR]