124 results on '"Iannuzzo, F."'
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2. Effect of short-circuit degradation on the remaining useful lifetime of SiC MOSFETs and its failure analysis
3. A non-invasive SiC MOSFET Junction temperature estimation method based on the transient light Emission from the intrinsic body diode
4. Parameters sensitivity analysis of silicon carbide buck converters to extract features for condition monitoring
5. Study of moisture transport in silicone gel for IGBT modules
6. FEM-aided damage model calibration method for experimental results
7. Evaluating IGBT temperature evolution during short circuit operations using a TSEP-based method
8. Implications of short-circuit events on power cycling of 1.2-kV/20-A SiC MOSFET power modules
9. SiC MOSFET vs SiC/Si Cascode short circuit robustness benchmark
10. Impact of device aging in the compact electro-thermal modeling of SiC power MOSFETs
11. Thermal modeling of wire-bonded power modules considering non-uniform temperature and electric current interactions
12. Smart SiC MOSFET accelerated lifetime testing
13. Investigating SiC MOSFET body diode's light emission as temperature-sensitive electrical parameter
14. Power cycling test of transfer molded IGBT modules by advanced power cycler under different junction temperature swings
15. Failure mechanism analysis of fuses subjected to manufacturing and operational thermal stresses
16. Investigation of acoustic emission as a non-invasive method for detection of power semiconductor aging
17. Investigation on the degradation indicators of short-circuit tests in 1.2 kV SiC MOSFET power modules
18. Comparative study of wire bond degradation under power and mechanical accelerated tests
19. Advanced power cycler with intelligent monitoring strategy of IGBT module under test
20. Capacitive effects in IGBTs limiting their reliability under short circuit
21. A survey of SiC power MOSFETs short-circuit robustness and failure mode analysis
22. Reliability-oriented environmental thermal stress analysis of fuses in power electronics
23. Mission-profile-based stress analysis of bond-wires in SiC power modules
24. Comparison of thermal runaway limits under different test conditions based on a 4.5 kV IGBT
25. Power cycling test and failure analysis of molded Intelligent Power IGBT Module under different temperature swing durations
26. Robustness of MW-Level IGBT modules against gate oscillations under short circuit events
27. Experimental study of Single Event Effects induced by heavy ion irradiation in enhancement mode GaN power HEMT
28. Junction temperature estimation method for a 600 V, 30A IGBT module during converter operation
29. Turn-off instabilities in large area IGBTs
30. Thermal damage in SiC Schottky diodes induced by SE heavy ions
31. Scattering parameter approach applied to the stability analysis of power IGBTs in short circuit
32. Thermal instability during short circuit of normally-off AlGaN/GaN HFETs
33. Behavior of power MOSFETs during heavy ions irradiation performed after γ-rays exposure
34. Unclamped repetitive stress on 1200 V normally-off SiC JFETs
35. Reliability oriented design of power supplies for high energy physics applications
36. A time-resolved IBICC experiment using the IEEM of the SIRAD facility
37. A new test methodology for an exhaustive study of single-event-effects on power MOSFETs
38. Experimental study and numerical investigation on the formation of single event gate damages induced on medium voltage power MOSFET
39. Instable mechanisms during unclamped operation of high power IGBT modules
40. Experimental study about gate oxide damages in patterned MOS capacitor irradiated with heavy ions
41. Experimental evidence of “latent gate oxide damages” in medium voltage power MOSFET as a result of heavy ions exposure
42. IGBT modules robustness during turn-off commutation
43. High performance, FPGA-based test apparatus for unclamped inductive switching of IGBTs
44. The robustness of series-connected high power IGBT modules
45. Experimental study of power MOSFET’s gate damage in radiation environment
46. The high frequency behaviour of high voltage and current IGBT modules
47. Investigation of MOSFET failure in soft-switching conditions
48. Experimental and Numerical investigation about SEB/SEGR of Power MOSFET
49. Analysis and optimisation through innovative driving strategy of high power IGBT performances/EMI reduction trade-off for converter systems in railway applications
50. Non-Destructive Detection of Current Distribution in Power Modules based on Pulsed Magnetic Measurement
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