Search

Influence of 30 kilo-electron-volt (keV) Argon (Ar ^+ ) ions on optical and electrical properties of nickel nanowires (Ni-NWs) meshes is being reported. Ni-NWs are being exposed to 30 keV Argon (Ar ^+ ) ions at various beam fluencies. These fluencies of Ar ^+ ions are 7 × 10 ^14 ions cm ^−2 , 3 × 10 ^15 ions cm ^−2 and 3 × 10 ^16 ions cm ^−2 . After irradiation, Ni-NWs meshes were analyzed through transmission electron microscopy technique (TEM). The structural analysis has been done through X-ray diffraction technique. It is found from TEM results that atoms are sputtered out from surfaces of Ni-NWs due to collision cascade effect persistently and lead to reduce the diameters or thicknesses of Ni-NWs. X-ray diffraction results reveal that crystalline quality is reduced under Ar ^+ ions irradiation which may be due to defects induced in Ni-NWs as a result of collision cascade effect. The Ni-NWs meshes are characterized optically and electrically through UV–VIS spectroscopy and four probe techniques. The optical transparencies of Ni-NWs meshes are increasing with increase in beam fluence of Ar ^+ ions. The electrical conductivity of the mesh is decreased continuously with increment in beam fluence of Ar ^+ ions which might be due to production of defects in Ni-NWs. The tuning of optical transparency and electrical conductivity of Ni-NWs meshes is required for their application as successful transparent electrodes in optoelectronic nanodevices.