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1. Physics-Based and Closed-Form Model for Cryo-CMOS Subthreshold Swing

2. Comphy v3.0 -- A Compact-Physics Framework for Modeling Charge Trapping Related Reliability Phenomena in MOS Devices

8. Evidence of contact-induced variability in industrially-fabricated highly-scaled MoS2 FETs.

12. NBTI in Nanoscale MOSFETs - The Ultimate Modeling Benchmark

15. Compact Physics Hot-Carrier Degradation Model Valid over a Wide Bias Range

16. Manufacturing Solutions

17. Impact of Nitridation on Bias Temperature Instability and Hard Breakdown Characteristics of SiON MOSFETs

21. Channel Hot Carriers and Other Reliability Mechanisms

22. Conclusions and Perspectives

23. Negative Bias Temperature Instability in Nanoscale Devices

24. Techniques and Devices

25. Negative Bias Temperature Instability in (Si)Ge pMOSFETs

26. Degradation Mechanisms

27. Introduction

31. A Pragmatic Model to Predict Future Device Aging

35. Modeling Self-Heating Effects in Nanoscale Devices

37. Summary of Tutorials

42. On Superior Hot Carrier Robustness of Dynamically-Doped Field-Effect-Transistors

43. Simulation Comparison of Hot-Carrier Degradation in Nanowire, Nanosheet and Forksheet FETs

46. Understanding and Modeling Opposite Impacts of Self-Heating on Hot-Carrier Degradation in n- and p-Channel Transistors

49. Deep Understanding of Electron Beam Effects on 2D Layered Semiconducting Devices Under Bias Applications

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