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7. Parasitic Reset in the Programming Transient of PCMs.

Author

Lelmini, D., Mantegazza, D., Lacaita, A. L., Pirovano, A., and Pellizzer, F.

Subjects
MATHEMATICAL programming, ELECTRIC transients, DYNAMICS, OSCILLATIONS, VIBRATION (Mechanics), FUNCTIONAL equations, MATHEMATICAL optimization
Abstract

We studied the programming dynamics in phase change memory cells. It is shown that programming in stand-alone cells is strongly affected by the parasitic capacitance in the measurement setup, leading to a current overshoot after threshold switching of the amorphous chalcogenide. This results in a parasitic melting and quenching of the active material, affecting the current distribution during program and the final phase distribution in the active material. The relevance of this artefact for real-device operation is discussed with reference to the value of the parasitic capacitance. [ABSTRACT FROM AUTHOR]

Published
2005
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