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A study was conducted to analyze the influence of a YBa2CU3O(sub 7-x) buffer layer on the quality of rf magnetron sputtered epitaxial (001) SrTiO3 thin films on a LaAlO3 substrate. High resolution transmission electron spectroscopy was utilized to carry out the analysis. The film was oriented with the (001) axis parallel to the normal of the substrate surface. Results indicated that rubbed polyimide alignment layers promoted a surface pretilt of 0.5 degrees.

A study demonstrated that electron energy-loss spectroscopy in transmission electron microscopy is a useful technique for analysis of the high-frequency dielectric properties on a microstructural level. Changes in the low frequency dielectric function between Sr deficient and stoichiometric films were much larger compared to the changes in the high-frequency function. It was found that strain and compositional deviations from the bulk value resulted in decreased ability to withstand dielectric breakdown.

High resolution analytical transmission electron microscopy was employed to determine the properties of the structural features of light emitting Si/SiO2 multilayers. Complex dielectric function was extracted from the experimental single-scattering distribution by utilizing the Kramers-Kronig analysis. This indicated the presence of an optical band gap at 1.5 eV. The first resonance peak in the imaginary portion of the complex dielectric constant was at 1.9 eV.

Research was conducted to characterize Sr-deficient and stoichiometric epitaxial (001) SrTiO3 films, deposited on (110)(sub rhombohedral) LaAlO3 substrates by x-ray diffraction and a high-resolution transmission electron microscopy. Objective of the study was to determine the reason for the significance of a heat treatment after deposition, tetragonal distortion and the influence of strain relaxation. Results indicate that the tetragonal distortion caused by the mismatch strain was concentrated to a narrow region closest to the film/substrate interface.