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Micro surface defects (SDs) would be unavoidably induced on most fused silica surfaces (FSSs), substantially reducing their laser-induced damage thresholds (LIDTs). There is still no clear understanding of the relation between SD structural feature and their LIDTs, which poses a challenge to the recognition and mitigation of the dangerous SDs with low LIDTs in industrial production. In this work, the brittle-plasticity and stress states of the SDs are found to dominate the atomic point-defect densities on FSSs and resultantly dominate their LIDTs for the first time. Based on this, the SDs have been divided into four categories: pressure-induced brittle defects (PBDs), pressure-induced plastic defects (PPDs), tension-induced brittle defects (TBDs) and tension-induced plastic defects (TPDs). Based on the tested LIDTs, laser damage morphologies and photoluminescence (PL) characteristics, the laser damage resistance of different kinds of SDs are compared, whose reasons are revealed on the basis of the molecular dynamics (MD) simulations. The sharp increase of the atomic point-defect density from the plasticity to the brittleness of the material, the significant disparity in tensile and compressive strength of fused silica, the distinctly different material response behaviours under tensile and compressive forces, as well as the opposite effects of the tensile and compressive forces on the material compactness significantly affect the atomic point-defect densities on FSSs and resultantly contribute to the different laser damage resistance of different kinds of SDs. This work possesses great significance in solving the laser damage on FSSs. It could also provide a new understanding of the impact of the tensile and compressive forces on the LIDTs of various optical elements. [ABSTRACT FROM AUTHOR]

The defect-induced laser damage on mechanically machined fused silica optical surfaces under intense laser irradiation severely threatens the laser damage resistance of optical components. The lack of a quantitative relationship between the feature information of surface defects and the laser-induced damage thresholds (LIDTs) of optical surfaces poses a challenge to effectively evaluate the influence of the surface defects on the LIDTs of optical surfaces. Herein, the photoluminescence (PL) properties of the areas where laser damage tends to occur in surface-defect zones are explored. The PL induced by the point defects at the atomic scale in these areas is found to be obviously higher than that of other positions. The PL envelope area (S) at the position with the highest PL intensity among the whole surface defect is found to be inversely proportional to the LIDT (Φ) of the optical surface for the first time (SΦ = N 0). It is beneficial to quantitatively characterize the influence of the surface defect and provide new insights in elucidating the defect-induced laser damage mechanisms. Besides, we found that there is a minimum LIDT for the mechanically machined optical surfaces with various surface defects. On basis of this, the maximum influence of the surface defects with different species on the LIDTs of optical surfaces could be determined. Based on the constructed relationship (SΦ = N 0) and the developed MD model, two causes of the minimum LIDT are determined. The PL envelope area of the surface defect would slightly affect the LIDT when the PL envelope area is large enough, which is the first cause. The mechanical force could compact the optical surface, increasing the densities of Si and O atoms. However, the densities of Si and O atoms become stable when the mechanical force is large enough, causing the highest densities of point defects, which is the second cause. [ABSTRACT FROM AUTHOR]

[Display omitted] • There are amounts of point defects at the atomic scale in the residual stress zones. • The STE point defects at the atomic scale distributed on the fused silica surface are found to be closely related to the residual stress on the fused silica surface for the first time. • PL-detection method is proposed to characterize the residual stress on the material surface for the first time. • The relative amount of STE point defect (K = S / S 0) is first proposed to quantitatively characterize the residual stress. The residual stress would have a significant impact on the service performance and fatigue life of the fused silica (non-crystal material) components (e.g., Hemispherical Shell Resonator). However, there is still no effective method for characterizing the residual stress on their working surfaces. Therefore, it is essential to develop a novel method for characterizing the residual stress on fused silica surfaces. Herein, the residual stress is found to significantly affect the mechanical properties of fused silica surfaces. On the basis of the study on the photoluminescence (PL) properties of residual stress zones, atomic point defects are found to be closely related to the residual stress. Based on an investigation of the PL properties of different types of mechanically processed surfaces, four types of point defects (ODCII, STE, Si clusters and NBOHCI) have been determined. On the basis of the molecular dynamics (MD) simulation results and the PL experiments on different types of mechanically processed surfaces, STE point defects at the atomic scale are found to be closely related to the residual stress for the first time. Based on this, PL-detection method is proposed to characterize the residual stress on the material surface for the first time. Besides, the relative amount of STE point defect (K = S/S 0) is first proposed to quantitatively characterize the residual stress. In sum, this work determines the structure at the atomic scale which is closely related to the residual stress and opens a convenient door to quantitatively characterize the residual stress with PL-detection method. It could also provide a reference for the characterization and even the alleviation of the residual stress on the surfaces of other non-crystal materials. [ABSTRACT FROM AUTHOR]

When serving in extremely high-power laser conditions, KH2PO4 (KDP) surfaces are susceptible to incur laser damage points (also known as defects). Using micro-ball end milling cutters to repair and remove the pre-existing damage points on the flawed KDP crystal surface is the most effective method to control the growth of laser damage points on KDP crystal surfaces and prolong their service life. However, there are various forms of micro-defects (such as pits, scratches and brittle fractures) around the laser damage points on KDP crystal surfaces which possess remarkable effects on the micro-milling repair process and consequently deteriorate the repair quality. In this work, combined with nano-indentation experiments, elastic–plastic mechanics and fracture mechanics theory, a constitutive model considering the anisotropic property of KDP crystals and a three-dimensional (3D) finite element model (FEM) were established to simulate the cutting force and surface topography involved in the ball-end milling repairing of flawed KDP crystal surfaces. Besides, the micro-milling experiments were conducted to evaluate the change of cutting force and machined surface quality in the presence of micro-defects with various feed rates. The results show that micro-defects would induce the fluctuation of cutting force and a change of the undeformed cutting thickness (UCT) in the process of repairing the damage points on the crystal surface, which would lead to the brittle–ductile transition (BDT) and affect the machined surface quality. The machined surface quality was found to be deteriorated by the pre-existing micro-defects when the UCT was small (the UCT was less than 375 nm). On the contrary, brittle mode cutting in the local area can be transformed into ductile mode cutting, resulting in an improvement of repaired surface quality that is exhibited by the cutting force and microtopography. This work has great theoretical significance and engineering practical value for the promotion and application of micro-milling repairing technology in the practical manufacturing and operation of KDP optics applied to high-power laser systems. [ABSTRACT FROM AUTHOR]